TREA

Hanxi Chen

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  • San Jose, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Efficient device debug system
    • Patent number 6,472,900
    • Issue date Oct 29, 2002
    • Sun Microsystems, Inc.
    • Deviprasad Malladi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Efficient debug package design
    • Patent number 6,246,252
    • Issue date Jun 12, 2001
    • Sun Microsystems, Inc.
    • Deviprasad Malladi
    • G01 - MEASURING TESTING