Hao-chih Liu

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New York, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for characterizing a probe tip
- Patent number 8,650,661
- Issue date Feb 11, 2014
- Bruker Nano, Inc.
- Gregory A. Dahlen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sidewall tracing nanoprobes, method for making the same, and method...
- Patent number 8,245,318
- Issue date Aug 14, 2012
- The Regents of the University of California
- Sungho Jin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods for utilizing scanning probe shape characteriza...
- Patent number 7,578,176
- Issue date Aug 25, 2009
- Veeco Metrology, Inc.
- Tianming Bao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Chip-Scale Frequency-Comb Assisted Coherent LIDAR Ranging With Sub-...
- Publication number 20210381819
- Publication date Dec 9, 2021
- The Regents of the University of California
- Yoon-Soo Jang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Characterizing a Probe Tip
- Publication number 20100313312
- Publication date Dec 9, 2010
- VEECO INSTRUMENTS INC.
- Gregory Dahlen
- G01 - MEASURING TESTING
Information Patent Application
SIDEWALL TRACING NANOPROBES, METHOD FOR MAKING THE SAME, AND METHOD...
- Publication number 20100005553
- Publication date Jan 7, 2010
- Sungho Jin
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for utilizing scanning probe shape characteriza...
- Publication number 20080154521
- Publication date Jun 26, 2008
- Tianming Bao
- G01 - MEASURING TESTING