Hao Chun YANG

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New Taipei City, TW

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Patents Applicationslast 30 patents

Information Patent Application
Defect Inspection System and Method
- Publication number 20240125713
- Publication date Apr 18, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hao Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Devices and Methods of Manufacture
- Publication number 20240124298
- Publication date Apr 18, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yun-Chung Wu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
BUMP STRUCTURE AND METHOD OF MAKING THE SAME
- Publication number 20240047397
- Publication date Feb 8, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Bo-Yu CHIU
- H01 - BASIC ELECTRIC ELEMENTS