Hao JIANG

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Madison, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Indirect photon-counting analytical X-ray detector
- Patent number 10,408,949
- Issue date Sep 10, 2019
- Hao Jiang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INDIRECT PHOTON-COUNTING ANALYTICAL X-RAY DETECTOR
- Publication number 20190056514
- Publication date Feb 21, 2019
- Bruker AXS, Inc.
- Hao JIANG
- G01 - MEASURING TESTING