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HAO WEI

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  • ZHUBEI CITY, TW
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE ASSEMBLY
    • Publication number 20220074970
    • Publication date Mar 10, 2022
    • MPI Corporation
    • Ming-Hsiang Hsieh
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD AND SIGNAL PATH SWITCHING MODULE ASSEMBLY
    • Publication number 20190120877
    • Publication date Apr 25, 2019
    • MPI Corporation
    • Hao WEI
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM
    • Publication number 20170146634
    • Publication date May 25, 2017
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MODULE
    • Publication number 20170115326
    • Publication date Apr 27, 2017
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MODULE SUPPORTING LOOPBACK TEST
    • Publication number 20170003319
    • Publication date Jan 5, 2017
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20160305981
    • Publication date Oct 20, 2016
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    HIGH-FREQUENCY CANTILEVER TYPE PROBE CARD
    • Publication number 20160139179
    • Publication date May 19, 2016
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
    • Publication number 20160018441
    • Publication date Jan 21, 2016
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
    • Publication number 20160018439
    • Publication date Jan 21, 2016
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM
    • Publication number 20150241544
    • Publication date Aug 27, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    Testing system and method for testing of electrical connections
    • Publication number 20150233969
    • Publication date Aug 20, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING JIG
    • Publication number 20150204905
    • Publication date Jul 23, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING JIG
    • Publication number 20150204906
    • Publication date Jul 23, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF OPERATING TESTING SYSTEM
    • Publication number 20150204962
    • Publication date Jul 23, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MODULE
    • Publication number 20150185253
    • Publication date Jul 2, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MODULE
    • Publication number 20150168453
    • Publication date Jun 18, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    CALIBRATION PLATE
    • Publication number 20150168531
    • Publication date Jun 18, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MODULE
    • Publication number 20150168447
    • Publication date Jun 18, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MODULE
    • Publication number 20150168454
    • Publication date Jun 18, 2015
    • MPI CORPORATION
    • WEI-CHENG KU
    • G01 - MEASURING TESTING