HaoMiao Chang

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Chupei City, TW

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Patents Applicationslast 30 patents

Information Patent Application
Measurements Of Semiconductor Structures Based On Data Collected At...
- Publication number 20250224344
- Publication date Jul 10, 2025
- KLA Corporation
- Houssam Chouaib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRA DELTA METROLOGY
- Publication number 20250123225
- Publication date Apr 17, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING