Harald Bloess

Person

Erfurt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscopy cantilever, corresponding manufacturing m...
- Patent number 7,635,392
- Issue date Dec 22, 2009
- Qimonda AG
- Harald Bloess
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring a surface profile of a sample
- Patent number 7,405,089
- Issue date Jul 29, 2008
- Infineon Technologies AG
- Harald Bloess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for the characterization of a depth structure...
- Patent number 7,005,640
- Issue date Feb 28, 2006
- Infineon Technologies AG
- Harald Bloess
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MOUNTING PHOTOVOLTAIC MODULES AND A PHOTOVOLTAIC ARRAY
- Publication number 20110265842
- Publication date Nov 3, 2011
- MASDAR PV GMBH
- Harald Bloess
- F24 - HEATING RANGES VENTILATING
Information Patent Application
METHOD FOR INSTALLING PHOTOVOLTAIC MODULES AND A PHOTOVOLTAIC ARRAY
- Publication number 20110162686
- Publication date Jul 7, 2011
- MASDAR PV GMBH
- Andreas Heidelberg
- F24 - HEATING RANGES VENTILATING
Information Patent Application
METHOD OF FABRICATING AN INTEGRATED CIRCUIT
- Publication number 20090301894
- Publication date Dec 10, 2009
- Carsten Ehlers
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
System and Method of Measuring Film Height on a Substrate
- Publication number 20090107399
- Publication date Apr 30, 2009
- Harald Bloess
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy cantilever, corresponding manufacturing m...
- Publication number 20090045336
- Publication date Feb 19, 2009
- Harald Bloess
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for the depth-resolved characterization of lay...
- Publication number 20060076494
- Publication date Apr 13, 2006
- Infineon Technologies AG
- Harald Bloess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring a surface profile of a sample
- Publication number 20050258365
- Publication date Nov 24, 2005
- Harald Bloess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for the characterization of a depth structure...
- Publication number 20050139768
- Publication date Jun 30, 2005
- Infineon Technologies AG
- Harald Bloess
- G01 - MEASURING TESTING

Harald Bloess

Person

Patents Grantslast 30 patents

Scanning probe microscopy cantilever, corresponding manufacturing m...

Method and apparatus for measuring a surface profile of a sample

Method and apparatus for the characterization of a depth structure...

Patents Applicationslast 30 patents

METHOD FOR MOUNTING PHOTOVOLTAIC MODULES AND A PHOTOVOLTAIC ARRAY

METHOD FOR INSTALLING PHOTOVOLTAIC MODULES AND A PHOTOVOLTAIC ARRAY

METHOD OF FABRICATING AN INTEGRATED CIRCUIT

System and Method of Measuring Film Height on a Substrate

Scanning probe microscopy cantilever, corresponding manufacturing m...

Method and apparatus for the depth-resolved characterization of lay...

Method and apparatus for measuring a surface profile of a sample

Method and apparatus for the characterization of a depth structure...