Harald Niebel

Person

Oberkochen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Precession diffraction charged particle beam system
- Patent number 8,541,739
- Issue date Sep 24, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a representation of an object by means of a pa...
- Patent number 8,471,202
- Issue date Jun 25, 2013
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device having a specimen holder
- Patent number 7,119,344
- Issue date Oct 10, 2006
- Carl Zeiss NTS GmbH
- Stephan Hiller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage lead-through for particle-beam apparatus
- Patent number 5,134,339
- Issue date Jul 28, 1992
- Carl-Zeiss-Stiftung
- Dietrich Hoffmeister
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
- Publication number 20240355577
- Publication date Oct 24, 2024
- Eldico Scientific AG
- Gunther STEINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...
- Publication number 20130270437
- Publication date Oct 17, 2013
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE...
- Publication number 20130234011
- Publication date Sep 12, 2013
- Harald Niebel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20120025094
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
Method for producing a representation of an object by means of a pa...
- Publication number 20110198497
- Publication date Aug 18, 2011
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for setting an operating parameter of a particle beam device...
- Publication number 20100230584
- Publication date Sep 16, 2010
- Harald Niebel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam device having a specimen holder
- Publication number 20050199810
- Publication date Sep 15, 2005
- Stephan Hiller
- H01 - BASIC ELECTRIC ELEMENTS

Harald Niebel

Person

Patents Grantslast 30 patents

Precession diffraction charged particle beam system

Method for producing a representation of an object by means of a pa...

Electron beam device having a specimen holder

High-voltage lead-through for particle-beam apparatus

Patents Applicationslast 30 patents

CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS

METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...

METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE...

CHARGED PARTICLE BEAM SYSTEM

Method for producing a representation of an object by means of a pa...

Method for setting an operating parameter of a particle beam device...

Electron beam device having a specimen holder