Harald Rose

Person

Darmstadt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 8,436,302
- Issue date May 7, 2013
- Carl Zeiss Microscopy GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 8,173,963
- Issue date May 8, 2012
- Carl Zeizz NTS GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrective for eliminating the third-order aperture aberration and...
- Patent number 7,989,776
- Issue date Aug 2, 2011
- CEOS Corrected Electron Optical Systems GmbH
- Heiko Müller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing image contrast by phase shifting in electron o...
- Patent number 7,973,289
- Issue date Jul 5, 2011
- CEOS Corrected Electron Optical Systems GmbH
- Joachim Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 7,902,506
- Issue date Mar 8, 2011
- Carl Zeiss NTS GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector for axial and off-axial beam paths
- Patent number 7,807,965
- Issue date Oct 5, 2010
- CEOS Corrected Electron Optical Systems GmbH
- Joachim Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical corrector for aplanatic imaging systems
- Patent number 7,800,076
- Issue date Sep 21, 2010
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector for correcting first-order chromatic aberrations of the f...
- Patent number 7,321,124
- Issue date Jan 22, 2008
- Carl Zeiss NTS GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector for correcting first-order chromatic aberrations of the f...
- Patent number 7,012,262
- Issue date Mar 14, 2006
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical particle corrector
- Patent number 6,888,145
- Issue date May 3, 2005
- CEOS Corrected Electron Optical Systems GmbH
- Heiko Müller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical corrector for eliminating third-order aberations
- Patent number 6,861,651
- Issue date Mar 1, 2005
- Carl Zeiss NTS GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system having a mirror corrector
- Patent number 6,855,939
- Issue date Feb 15, 2005
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic corrector
- Patent number 6,836,372
- Issue date Dec 28, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic corrector for eliminating the chromatic aberration of...
- Patent number 6,797,962
- Issue date Sep 28, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector for correcting first-order chromatic aberrations of the f...
- Patent number 6,784,437
- Issue date Aug 31, 2004
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical lens arrangement with an axis that can be largely...
- Patent number 6,774,372
- Issue date Aug 10, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy filter with magnetic deflecting regions
- Patent number 6,559,445
- Issue date May 6, 2003
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging electron energy filter
- Patent number 5,449,914
- Issue date Sep 12, 1995
- Carl-Zeiss-Stiftung
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter with correction of a second-order chromatic aberration
- Patent number 5,448,063
- Issue date Sep 5, 1995
- U.S. Philips Corporation
- Alan F. De Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 5,336,885
- Issue date Aug 9, 1994
- U.S. Philips Corporation
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging system for charged particles
- Patent number 5,319,207
- Issue date Jun 7, 1994
- Carl-Zeiss-Stiftung
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter for charged particle beam apparatus
- Patent number 5,126,565
- Issue date Jun 30, 1992
- U.S. Philips Corp.
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correction system for a charged-particle beam apparatus
- Patent number 5,084,622
- Issue date Jan 28, 1992
- U.S. Philips Corporation
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam generator
- Patent number 4,980,558
- Issue date Dec 25, 1990
- Siemens Aktiengesellschaft
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien-type imaging corrector for an electron microscope
- Patent number 4,962,313
- Issue date Oct 9, 1990
- Carl-Zeiss-Stiftung
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector objective for scanning microscopes
- Patent number 4,896,036
- Issue date Jan 23, 1990
- Siemens Aktiengesellschaft
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus for low-error imaging of line-shaped subjects
- Patent number 4,853,545
- Issue date Aug 1, 1989
- Siemens Aktiengesellschaft
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flat picture-reproducing device
- Patent number 4,794,306
- Issue date Dec 27, 1988
- Standard Elektrik Lorenz AG
- Kurt-Manfred Tischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alpha-type electron energy filter
- Patent number 4,760,261
- Issue date Jul 26, 1988
- Carl-Zeiss-Stiftung
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Omega-type electron energy filter
- Patent number 4,740,704
- Issue date Apr 26, 1988
- Carl-Zeiss-Stiftung
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIF...
- Publication number 20130001445
- Publication date Jan 3, 2013
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase-shifting element and particle beam device having a phase-shif...
- Publication number 20110233402
- Publication date Sep 29, 2011
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method
- Publication number 20100213369
- Publication date Aug 26, 2010
- Joachim Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Corrector for axial and off-axial beam paths
- Publication number 20090146056
- Publication date Jun 11, 2009
- CEOS Corrected Electron Optical Systems GmbH
- Joachim Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON-OPTICAL CORRECTOR FOR APLANATIC IMAGING SYSTEMS
- Publication number 20090134339
- Publication date May 28, 2009
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase-shifting element and particle beam device having a phase-shif...
- Publication number 20080296509
- Publication date Dec 4, 2008
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Corrective For Eliminating the Third-Order Aperture Aberration and...
- Publication number 20080283749
- Publication date Nov 20, 2008
- Heiko Muller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Corrector for correcting first-order chromatic aberrations of the f...
- Publication number 20060102848
- Publication date May 18, 2006
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- B82 - NANO-TECHNOLOGY
Information Patent Application
Corrector for correcting first-order chromatic aberrations of the f...
- Publication number 20050023480
- Publication date Feb 3, 2005
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- B82 - NANO-TECHNOLOGY
Information Patent Application
Optical particle corrector
- Publication number 20040155200
- Publication date Aug 12, 2004
- Heiko Muller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic corrector
- Publication number 20040051985
- Publication date Mar 18, 2004
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle beam system having a mirror corrector
- Publication number 20040036031
- Publication date Feb 26, 2004
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Corrector for correcting first-order chromatic aberrations of the f...
- Publication number 20030111613
- Publication date Jun 19, 2003
- Harald Rose
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron-optical corrector for eliminating third-order aberations
- Publication number 20030034457
- Publication date Feb 20, 2003
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron energy filter with magnetic deflecting regions
- Publication number 20020033455
- Publication date Mar 21, 2002
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS

Harald Rose

Person

Patents Grantslast 30 patents

Phase-shifting element and particle beam device having a phase-shif...

Phase-shifting element and particle beam device having a phase-shif...

Corrective for eliminating the third-order aperture aberration and...

Method for producing image contrast by phase shifting in electron o...

Phase-shifting element and particle beam device having a phase-shif...

Corrector for axial and off-axial beam paths

Electron-optical corrector for aplanatic imaging systems

Corrector for correcting first-order chromatic aberrations of the f...

Corrector for correcting first-order chromatic aberrations of the f...

Optical particle corrector

Electron-optical corrector for eliminating third-order aberations

Particle beam system having a mirror corrector

Electrostatic corrector

Electrostatic corrector for eliminating the chromatic aberration of...

Corrector for correcting first-order chromatic aberrations of the f...

Electron-optical lens arrangement with an axis that can be largely...

Electron energy filter with magnetic deflecting regions

Imaging electron energy filter

Energy filter with correction of a second-order chromatic aberration

Electron beam apparatus

Imaging system for charged particles

Energy filter for charged particle beam apparatus

Correction system for a charged-particle beam apparatus

Electron beam generator

Wien-type imaging corrector for an electron microscope

Detector objective for scanning microscopes

Particle beam apparatus for low-error imaging of line-shaped subjects

Flat picture-reproducing device

Alpha-type electron energy filter

Omega-type electron energy filter

Patents Applicationslast 30 patents

PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIF...

Phase-shifting element and particle beam device having a phase-shif...

Method

Corrector for axial and off-axial beam paths

ELECTRON-OPTICAL CORRECTOR FOR APLANATIC IMAGING SYSTEMS

Phase-shifting element and particle beam device having a phase-shif...

Corrective For Eliminating the Third-Order Aperture Aberration and...

Corrector for correcting first-order chromatic aberrations of the f...

Corrector for correcting first-order chromatic aberrations of the f...

Optical particle corrector

Electrostatic corrector

Particle beam system having a mirror corrector

Corrector for correcting first-order chromatic aberrations of the f...

Electron-optical corrector for eliminating third-order aberations

Electron energy filter with magnetic deflecting regions