Harald Schneider

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Geesthacht, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and arrangement for analyzing specimens pursuant to the x-ra...
- Patent number 5,077,766
- Issue date Dec 31, 1991
- CKSS Forschungszentrum Geesthacht GmbH
- Heinrich Schwenke
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for the non-destructive measurement of metal traces
- Patent number 4,847,882
- Issue date Jul 11, 1989
- GKSS-Forschungszentrum-Geesthacht GmbH
- Joachim Knoth
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for quantitative in-line X-ray fluorescence analysis of s...
- Patent number 4,125,769
- Issue date Nov 14, 1978
- Gesellschaft fur Kernenergieverwertung in Schiffbau und Schiffahrt mbH
- Rainer Marten
- G01 - MEASURING TESTING