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Harald Wanka
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Reutlingen, DE
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Patents Grants
last 30 patents
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Patent Grant
Method for producing defined polycrystalline silicon areas in an am...
Patent number
7,012,026
Issue date
Mar 14, 2006
Robert Bosch GmbH
Walter Emili
G01 - MEASURING TESTING
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Patent Grant
Planar trimming resistor, applications and method for its manufacture
Patent number
6,667,683
Issue date
Dec 23, 2003
Robert Bosch GmbH
Walter Emili
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Method for manufacturing a thin-layer component, in particular a th...
Publication number
20050275502
Publication date
Dec 15, 2005
Herbert Goebel
G01 - MEASURING TESTING
Information
Patent Application
Method for producing defined polycrystalline silicon areas in an am...
Publication number
20040026358
Publication date
Feb 12, 2004
Walter Emili
G01 - MEASURING TESTING
Information
Patent Application
Production method for a thin-layer component, especially a thin-lay...
Publication number
20040026367
Publication date
Feb 12, 2004
Herbert Goebel
G01 - MEASURING TESTING