Harel Ilan

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Rehovot, IL

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Patents Grantslast 30 patents

Information Patent Grant
Multi-perspective wafer analysis
- Patent number 11,815,470
- Issue date Nov 14, 2023
- Applied Materials Israel, Ltd.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-perspective wafer analysis using an acousto-optic deflector
- Patent number 11,195,267
- Issue date Dec 7, 2021
- Applied Materials Israel Ltd.
- Harel Ilan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computerized system and method for obtaining information about a re...
- Patent number 10,902,582
- Issue date Jan 26, 2021
- Applied Materials Israel, Ltd.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and a method for evaluating an exit pupil of an i...
- Patent number 9,846,128
- Issue date Dec 19, 2017
- Applied Materials Israel Ltd.
- Harel Ilan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-PERSPECTIVE WAFER ANALYSIS
- Publication number 20200400589
- Publication date Dec 24, 2020
- Applied Materials Israel, Ltd.
- Haim FELDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-PERSPECTIVE WAFER ANALYSIS
- Publication number 20200232934
- Publication date Jul 23, 2020
- APPLIED MATERIALS ISRAEL, LTD.
- Haim FELDMAN
- G01 - MEASURING TESTING
Information Patent Application
COMPUTERIZED SYSTEM AND METHOD FOR OBTAINING INFORMATION ABOUT A RE...
- Publication number 20200234418
- Publication date Jul 23, 2020
- Applied Materials Israel, Ltd.
- Haim FELDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and a Method for Evaluating an Exit Pupil of an I...
- Publication number 20170205359
- Publication date Jul 20, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Harel Ilan
- G01 - MEASURING TESTING