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HARGURPREET SINGH
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Poughkeepsie, NY, US
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last 30 patents
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Patent Grant
Method of adaptively selecting chips for reducing in-line testing i...
Patent number
7,682,842
Issue date
Mar 23, 2010
International Business Machines Corporation
Rao H. Desineni
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method of Adaptively Selecting Chips for Reducing In-line Testing i...
Publication number
20090299679
Publication date
Dec 3, 2009
International Business Machines Corporation
RAO H. DESINENI
G01 - MEASURING TESTING