Hari Krishnan Rajeev

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Kerala, IN

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Patents Grantslast 30 patents

Information Patent Grant
Operating pulsed latches on a variable power supply
- Patent number 11,112,854
- Issue date Sep 7, 2021
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating pulsed latches on a variable power supply
- Patent number 10,386,912
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bitwise rotating scan section for microelectronic chip testing and...
- Patent number 10,107,860
- Issue date Oct 23, 2018
- International Business Machines Corporation
- Todd L. Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Portion isolation architecture for chip isolation test
- Patent number 10,067,183
- Issue date Sep 4, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test pattern generation (ATPG) considering crosstalk effects
- Patent number 9,218,447
- Issue date Dec 22, 2015
- International Business Machines Corporation
- Kanad Basu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programming a microchip ID register
- Patent number 8,130,526
- Issue date Mar 6, 2012
- International Business Machines Corporation
- Kelageri Nagaraj
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY
- Publication number 20190286221
- Publication date Sep 19, 2019
- International Business Machines Corporation
- STEVEN M. DOUSKEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY
- Publication number 20180196497
- Publication date Jul 12, 2018
- International Business Machines Corporation
- STEVEN M. DOUSKEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PORTION ISOLATION ARCHITECTURE FOR CHIP ISOLATION TEST
- Publication number 20170363683
- Publication date Dec 21, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
BITWISE ROTATING SCAN SECTION FOR MICROELECTRONIC CHIP TESTING AND...
- Publication number 20170363684
- Publication date Dec 21, 2017
- International Business Machines Corporation
- Todd L. Cohen
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST PATTERN GENERATION (ATPG) CONSIDERING CROSSTALK EFFECTS
- Publication number 20150199466
- Publication date Jul 16, 2015
- International Business Machines Corporation
- Kanad Basu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAMMING A MICROCHIP ID REGISTER
- Publication number 20090039347
- Publication date Feb 12, 2009
- Kelageri Nagaraj
- G11 - INFORMATION STORAGE