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Haris Basit
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Three dimensional circuit formation
Patent number
11,076,492
Issue date
Jul 27, 2021
AVERATEK CORPORATION
Shinichi Iketani
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
True time delay phase array radar using rotary clocks and electroni...
Patent number
8,629,807
Issue date
Jan 14, 2014
Analog Devices, Inc.
John Wood
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
THREE DIMENSIONAL CIRCUIT FORMATION
Publication number
20210345498
Publication date
Nov 4, 2021
Averatek Corporation
Shinichi IKETANI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Methods of Plating onto Sacrificial Material and Components Made T...
Publication number
20210265716
Publication date
Aug 26, 2021
Averatek Corporation
Haris BASIT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING
Publication number
20210045252
Publication date
Feb 11, 2021
Averatek Corporation
Haris BASIT
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
THREE DIMENSIONAL CIRCUIT FORMATION
Publication number
20200196456
Publication date
Jun 18, 2020
Averatek Corporation
Shinichi IKETANI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF MANUFACTURE FOR EMBEDDED IC CHIP DIRECTLY CONNECTED TO PCB
Publication number
20200120811
Publication date
Apr 16, 2020
Averatek Corporation
Haris BASIT
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MAXIMIZING SURFACES AND MINIMIZING PROXIMITY EFFECTS FOR ELECTRIC W...
Publication number
20190244726
Publication date
Aug 8, 2019
Averatek Corporation
Haris Basit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRUE TIME DELAY PHASE ARRAY RADAR USING ROTARY CLOCKS AND ELECTRONI...
Publication number
20120039366
Publication date
Feb 16, 2012
MOBIUS POWER, LLC
John Wood
G01 - MEASURING TESTING