Harish Singidi

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Executing a refresh operation in a memory sub-system
- Patent number 12,009,042
- Issue date Jun 11, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Erase cycle healing using a high voltage pulse
- Patent number 11,978,514
- Issue date May 7, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Performing a program operation based on a high voltage pulse to sec...
- Patent number 11,942,160
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line group read counters
- Patent number 11,934,689
- Issue date Mar 19, 2024
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-page parity data storage in a memory device
- Patent number 11,928,353
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- Harish R Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reactive read based on metrics to screen defect prone memory blocks
- Patent number 11,914,490
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Harish Reddy Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing storage of multiple plane parity data in a memory sub-system
- Patent number 11,907,066
- Issue date Feb 20, 2024
- Micron Technology, Inc.
- Xiangang Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature informed memory refresh
- Patent number 11,887,651
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aggressive quick-pass multiphase programming for voltage distributi...
- Patent number 11,854,611
- Issue date Dec 26, 2023
- SanDisk Technologies LLC
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Relocating data to low latency memory
- Patent number 11,836,392
- Issue date Dec 5, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective read disturb sampling
- Patent number 11,810,627
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read count scaling factor for data integrity scan
- Patent number 11,782,627
- Issue date Oct 10, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read error recovery
- Patent number 11,775,181
- Issue date Oct 3, 2023
- Micron Technology, Inc.
- Xiangang Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modified distribution of memory device states
- Patent number 11,776,639
- Issue date Oct 3, 2023
- Western Digital Technologies, Inc.
- Amiya Banerjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Prioritization of error control operations at a memory sub-system
- Patent number 11,740,957
- Issue date Aug 29, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective relocation of data of a subset of a data block based on d...
- Patent number 11,740,805
- Issue date Aug 29, 2023
- Micron Technology, Inc.
- Ashutosh Malshe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secure erase for data corruption
- Patent number 11,735,269
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Ting Luo
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic valley searching in solid state drives
- Patent number 11,727,996
- Issue date Aug 15, 2023
- Western Digital Technologies, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-page parity protection with power loss handling
- Patent number 11,726,867
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Harish Reddy Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adjusting scan event thresholds to mitigate memory errors
- Patent number 11,709,633
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Regression-based calibration and scanning of data units
- Patent number 11,704,179
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective sampling of a data unit during a program erase cycle base...
- Patent number 11,698,832
- Issue date Jul 11, 2023
- Micron Technology, Inc.
- Harish R. Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Uncorrectable ECC
- Patent number 11,694,760
- Issue date Jul 4, 2023
- Micron Technology, Inc.
- Jianmin Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
SLC page read
- Patent number 11,688,473
- Issue date Jun 27, 2023
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Selective wordline scans based on a data state metric
- Patent number 11,682,446
- Issue date Jun 20, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Read voltage calibration based on host IO operations
- Patent number 11,670,381
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- Ashutosh Malshe
- G11 - INFORMATION STORAGE
Information Patent Grant
Selective sampling of a data unit based on program/erase execution...
- Patent number 11,656,931
- Issue date May 23, 2023
- Micron Technology, Inc.
- Harish R. Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
NAND temperature data management
- Patent number 11,610,632
- Issue date Mar 21, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-page parity data storage in a memory device
- Patent number 11,561,722
- Issue date Jan 24, 2023
- Micron Technology, Inc.
- Harish R Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature correction in memory sub-systems
- Patent number 11,544,008
- Issue date Jan 3, 2023
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-PAGE PARITY DATA STORAGE IN A MEMORY DEVICE
- Publication number 20230153011
- Publication date May 18, 2023
- Micron Technology, Inc.
- Harish R. Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERFORMING A PROGRAM OPERATION BASED ON A HIGH VOLTAGE PULSE TO SEC...
- Publication number 20230110545
- Publication date Apr 13, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
WORD LINE GROUP READ COUNTERS
- Publication number 20230076362
- Publication date Mar 9, 2023
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXECUTING A REFRESH OPERATION IN A MEMORY SUB-SYSTEM
- Publication number 20230059923
- Publication date Feb 23, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Modified Distribution of Memory Device States
- Publication number 20230021663
- Publication date Jan 26, 2023
- Western Digital Technologies, Inc.
- Amiya Banerjee
- G11 - INFORMATION STORAGE
Information Patent Application
Dynamic Valley Searching in Solid State Drives
- Publication number 20230023725
- Publication date Jan 26, 2023
- Western Digital Technologies, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
SELECTIVE RELOCATION OF DATA OF A SUBSET OF A DATA BLOCK BASED ON D...
- Publication number 20220391104
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Ashutosh Malshe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE READ DISTURB SAMPLING
- Publication number 20220383962
- Publication date Dec 1, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Aggressive Quick-Pass Multiphase Programming for Voltage Distributi...
- Publication number 20220375513
- Publication date Nov 24, 2022
- SANDISK TECHNOLOGIES LLC
- Harish Singidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic Valley Searching in Solid State Drives
- Publication number 20220293191
- Publication date Sep 15, 2022
- Western Digital Technologies, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE INFORMED MEMORY REFRESH
- Publication number 20220277787
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-PAGE PARITY PROTECTION WITH POWER LOSS HANDLING
- Publication number 20220269559
- Publication date Aug 25, 2022
- Micron Technology, Inc.
- Harish Reddy Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING STORAGE OF MULTIPLE PLANE PARITY DATA IN A MEMORY SUB-SYSTEM
- Publication number 20220261313
- Publication date Aug 18, 2022
- Micron Technology, Inc.
- Xiangang Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ ERROR RECOVERY
- Publication number 20220221993
- Publication date Jul 14, 2022
- Micron Technology, Inc.
- Xiangang Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTING SCAN EVENT THRESHOLDS TO MITIGATE MEMORY ERRORS
- Publication number 20220188040
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE WORDLINE SCANS BASED ON A DATA STATE METRIC
- Publication number 20220180922
- Publication date Jun 9, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
READ COUNT SCALING FACTOR FOR DATA INTEGRITY SCAN
- Publication number 20220179577
- Publication date Jun 9, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURE ERASE FOR DATA CORRUPTION
- Publication number 20220157386
- Publication date May 19, 2022
- MIRCRON TECHNOLOGY, INC.
- Ting Luo
- G11 - INFORMATION STORAGE
Information Patent Application
ADJUSTING A RELIABILITY SCAN THRESHOLD IN A MEMORY SUB-SYSTEM
- Publication number 20220139481
- Publication date May 5, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORD LINE GROUP READ COUNTERS
- Publication number 20220129187
- Publication date Apr 28, 2022
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE SAMPLING OF A DATA UNIT BASED ON PROGRAM/ERASE EXECUTION...
- Publication number 20220083408
- Publication date Mar 17, 2022
- Micron Technology, Inc.
- Harish R. Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Level Dependent Error Correction Code Protection in Multi-Level Non...
- Publication number 20220068423
- Publication date Mar 3, 2022
- Western Digital Technologies, Inc.
- Nian YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-PAGE PARITY DATA STORAGE IN A MEMORY DEVICE
- Publication number 20220066678
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Harish R. Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REGRESSION-BASED CALIBRATION AND SCANNING OF DATA UNITS
- Publication number 20220050735
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRIORITIZATION OF ERROR CONTROL OPERATIONS AT A MEMORY SUB-SYSTEM
- Publication number 20220043706
- Publication date Feb 10, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RELOCATING DATA TO LOW LATENCY MEMORY
- Publication number 20220027062
- Publication date Jan 27, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REACTIVE READ BASED ON METRICS TO SCREEN DEFECT PRONE MEMORY BLOCKS
- Publication number 20220019507
- Publication date Jan 20, 2022
- Micron Technology, Inc.
- Harish Reddy Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARITY PROTECTION
- Publication number 20210390014
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Chun Sum Yeung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE SAMPLING OF A DATA UNIT DURING A PROGRAM ERASE CYCLE BASE...
- Publication number 20210390016
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Harish R. Singidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNCORRECTABLE ECC
- Publication number 20210350871
- Publication date Nov 11, 2021
- Micron Technology, Inc.
- Jianmin Huang
- G11 - INFORMATION STORAGE

Harish Singidi

Person

Patents Grantslast 30 patents

Executing a refresh operation in a memory sub-system

Erase cycle healing using a high voltage pulse

Performing a program operation based on a high voltage pulse to sec...

Word line group read counters

Multi-page parity data storage in a memory device

Reactive read based on metrics to screen defect prone memory blocks

Managing storage of multiple plane parity data in a memory sub-system

Temperature informed memory refresh

Aggressive quick-pass multiphase programming for voltage distributi...

Relocating data to low latency memory

Selective read disturb sampling

Read count scaling factor for data integrity scan

Read error recovery

Modified distribution of memory device states

Prioritization of error control operations at a memory sub-system

Selective relocation of data of a subset of a data block based on d...

Secure erase for data corruption

Dynamic valley searching in solid state drives

Multi-page parity protection with power loss handling

Adjusting scan event thresholds to mitigate memory errors

Regression-based calibration and scanning of data units

Selective sampling of a data unit during a program erase cycle base...

Uncorrectable ECC

SLC page read

Selective wordline scans based on a data state metric

Read voltage calibration based on host IO operations

Selective sampling of a data unit based on program/erase execution...

NAND temperature data management

Multi-page parity data storage in a memory device

Temperature correction in memory sub-systems

Patents Applicationslast 30 patents

MULTI-PAGE PARITY DATA STORAGE IN A MEMORY DEVICE

PERFORMING A PROGRAM OPERATION BASED ON A HIGH VOLTAGE PULSE TO SEC...

WORD LINE GROUP READ COUNTERS

EXECUTING A REFRESH OPERATION IN A MEMORY SUB-SYSTEM

Modified Distribution of Memory Device States

Dynamic Valley Searching in Solid State Drives

SELECTIVE RELOCATION OF DATA OF A SUBSET OF A DATA BLOCK BASED ON D...

SELECTIVE READ DISTURB SAMPLING

Aggressive Quick-Pass Multiphase Programming for Voltage Distributi...

Dynamic Valley Searching in Solid State Drives

TEMPERATURE INFORMED MEMORY REFRESH

MULTI-PAGE PARITY PROTECTION WITH POWER LOSS HANDLING

MANAGING STORAGE OF MULTIPLE PLANE PARITY DATA IN A MEMORY SUB-SYSTEM

READ ERROR RECOVERY

ADJUSTING SCAN EVENT THRESHOLDS TO MITIGATE MEMORY ERRORS

SELECTIVE WORDLINE SCANS BASED ON A DATA STATE METRIC

READ COUNT SCALING FACTOR FOR DATA INTEGRITY SCAN

SECURE ERASE FOR DATA CORRUPTION

ADJUSTING A RELIABILITY SCAN THRESHOLD IN A MEMORY SUB-SYSTEM

WORD LINE GROUP READ COUNTERS

SELECTIVE SAMPLING OF A DATA UNIT BASED ON PROGRAM/ERASE EXECUTION...

Level Dependent Error Correction Code Protection in Multi-Level Non...

MULTI-PAGE PARITY DATA STORAGE IN A MEMORY DEVICE

REGRESSION-BASED CALIBRATION AND SCANNING OF DATA UNITS

PRIORITIZATION OF ERROR CONTROL OPERATIONS AT A MEMORY SUB-SYSTEM

RELOCATING DATA TO LOW LATENCY MEMORY

REACTIVE READ BASED ON METRICS TO SCREEN DEFECT PRONE MEMORY BLOCKS

PARITY PROTECTION

SELECTIVE SAMPLING OF A DATA UNIT DURING A PROGRAM ERASE CYCLE BASE...

UNCORRECTABLE ECC