Harmander Singh

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Current in-rush mitigation for power-up of embedded memories
- Patent number 10,353,447
- Issue date Jul 16, 2019
- QUALCOMM Incorporated
- Harmander Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power and performance aware memory-controller voting mechanism
- Patent number 10,331,195
- Issue date Jun 25, 2019
- QUALCOMM Incorporated
- Milena Vratonjic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage detector with high voltage protection
- Patent number 9,541,583
- Issue date Jan 10, 2017
- Intel Corporation
- Harmander Singh
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for dynamically adjusting memory rail voltage
- Patent number 9,299,419
- Issue date Mar 29, 2016
- QUALCOMM Incorporated
- Harmander Singh
- G11 - INFORMATION STORAGE
Information Patent Grant
Correction of delay-based metric measurements using delay circuits...
- Patent number 7,548,823
- Issue date Jun 16, 2009
- International Business Machines Corporation
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of multi-metric sensitive delay measurement circuits
- Patent number 7,542,862
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Harmander Singh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CURRENT IN-RUSH MITIGATION FOR POWER-UP OF EMBEDDED MEMORIES
- Publication number 20180253129
- Publication date Sep 6, 2018
- QUALCOMM Incorporated
- Harmander Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER AND PERFORMANCE AWARE MEMORY-CONTROLLER VOTING MECHANISM
- Publication number 20170351316
- Publication date Dec 7, 2017
- QUALCOMM Incorporated
- Milena Vratonjic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE DETECTOR WITH HIGH VOLTAGE PROTECTION
- Publication number 20140334049
- Publication date Nov 13, 2014
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION OF MULTI-METRIC SENSITIVE DELAY MEASUREMENT CIRCUITS
- Publication number 20090144006
- Publication date Jun 4, 2009
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
Calibration of Multi-Metric Sensitive Delay Measurement Circuits
- Publication number 20080288197
- Publication date Nov 20, 2008
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
Correction of Delay-Based Metric Measurements Using Delay Circuits...
- Publication number 20080288196
- Publication date Nov 20, 2008
- Harmander Singh
- G01 - MEASURING TESTING