Harold Dozier

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Mutable cells for use in integrated circuits
- Patent number 7,840,927
- Issue date Nov 23, 2010
- Harold Wallace Dozier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multipurpose test chip input/output circuit
- Patent number 6,535,049
- Issue date Mar 18, 2003
- Hewlett-Packard Company
- Dwight Jaynes
- G01 - MEASURING TESTING
Information Patent Grant
Test chip circuit for on-chip timing characterization
- Patent number 5,787,092
- Issue date Jul 28, 1998
- Hewlett-Packard Co.
- Dwight Jaynes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multipurpose test chip input/output circuit
- Publication number 20020030531
- Publication date Mar 14, 2002
- Dwight Jaynes
- G01 - MEASURING TESTING