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Harold Sebastiaan BUDDENBERG
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Sittard, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection substrate and an inspection method
Patent number
10,725,390
Issue date
Jul 28, 2020
ASML Netherlands B.V.
Seerwan Saeed
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Substrate table, a lithographic apparatus and a method of operating...
Patent number
10,571,810
Issue date
Feb 25, 2020
ASML Netherlands B.V.
Daan Daniel Johannes Antonius Van Sommeren
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Substrate table, lithographic apparatus and method of operating a l...
Patent number
10,317,804
Issue date
Jun 11, 2019
ASML Netherlands B.V.
Daan Daniel Johannes Antonius Van Sommeren
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Inspection substrate and an inspection method
Patent number
10,216,100
Issue date
Feb 26, 2019
ASML Netherlands B.V.
Seerwan Saeed
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
FLUID HANDLING STRUCTURE FOR LITHOGRAPHIC APPARATUS
Publication number
20200409270
Publication date
Dec 31, 2020
ASML NETHERLANDS B.V.
Pepijn VAN DEN EIJNDEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SUBSTRATE TABLE, A LITHOGRAPHIC APPARATUS AND A METHOD OF OPERATING...
Publication number
20190265597
Publication date
Aug 29, 2019
ASML NETHERLANDS B.V.
Daan Daniel Johannes Antonius VAN SOMMEREN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Inspection Substrate and an Inspection Method
Publication number
20190146352
Publication date
May 16, 2019
ASML NETHERLANDS B.V.
Seerwan Saeed
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SUBSTRATE TABLE, LITHOGRAPHIC APPARATUS AND METHOD OF OPERATING A L...
Publication number
20180364584
Publication date
Dec 20, 2018
ASML NETHERLANDS B.V.
Daan Daniel Johannes Antonius VAN SOMMEREN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Inspection Substrate and an Inspection Method
Publication number
20180181004
Publication date
Jun 28, 2018
ASML NETHERLANDS B.V.
Seerwan SAEED
H01 - BASIC ELECTRIC ELEMENTS