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Harry A. Schmitt
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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method of orbital angular momentum (OAM) diverse signal...
Patent number
7,701,381
Issue date
Apr 20, 2010
Raytheon Company
Harry A. Schmitt
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral imaging chip using photonic crystals
Patent number
7,145,124
Issue date
Dec 5, 2006
Raytheon Company
Dennis J Garrood
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Electric field resonance assisted Raman scattering for ladar IFF
Patent number
7,046,358
Issue date
May 16, 2006
Raytheon Company
Delmar L. Barker
G01 - MEASURING TESTING
Information
Patent Grant
System and method for tracking beam-aspect targets with combined Ka...
Patent number
7,046,188
Issue date
May 16, 2006
Raytheon Company
David A. Zaugg
G01 - MEASURING TESTING
Information
Patent Grant
Non-traditional adaptive non-uniformity compensation (ADNUC) system...
Patent number
7,035,475
Issue date
Apr 25, 2006
Raytheon Company
Hai-Wen Chen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Low phase-noise local oscillator and method
Patent number
6,967,539
Issue date
Nov 22, 2005
Raytheon Company
Michael R. Beylor
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High density storage of excited positronium using photonic bandgap...
Patent number
6,813,330
Issue date
Nov 2, 2004
Raytheon Company
Delmar L. Barker
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Radome compensation using matched negative index or refraction mate...
Patent number
6,788,273
Issue date
Sep 7, 2004
Raytheon Company
Stephen M. Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave absorbing material
Patent number
6,756,932
Issue date
Jun 29, 2004
Raytheon Company
Delmar L. Barker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for detecting and estimating the direction of nea...
Patent number
6,750,804
Issue date
Jun 15, 2004
Raytheon Company
Hai-Wai Chen
G01 - MEASURING TESTING
Information
Patent Grant
Optical accelerometer and its use to measure acceleration
Patent number
6,567,174
Issue date
May 20, 2003
Raytheon Company
Delmar L. Barker
G01 - MEASURING TESTING
Information
Patent Grant
Far field emulator for antenna calibration
Patent number
6,531,989
Issue date
Mar 11, 2003
Raytheon Company
Delmar L. Barker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-resolution object classification method employing kinematic f...
Patent number
6,393,137
Issue date
May 21, 2002
Raytheon Company
Hai-Wen Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Adaptive non-uniformity compensation using feedforward shunting and...
Patent number
6,330,371
Issue date
Dec 11, 2001
Raytheon Company
Hai-Wen Chen
G01 - MEASURING TESTING
Information
Patent Grant
Efficient multi-resolution space-time adaptive processor
Patent number
6,292,592
Issue date
Sep 18, 2001
Raytheon Company
Dennis C. Braunreiter
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive non-uniformity compensation using feedforwarding shunting
Patent number
6,243,498
Issue date
Jun 5, 2001
Raytheon Company
Hai-Wen Chen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Adaptive non-uniformity compensation using feedforward shunting and...
Patent number
6,211,515
Issue date
Apr 3, 2001
Raytheon Company
Hai-Wen Chen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD OF ORBITAL ANGULAR MOMENTUM (OAM) DIVERSE SIGNAL...
Publication number
20100013696
Publication date
Jan 21, 2010
Raytheon Company
HARRY A. SCHMITT
G01 - MEASURING TESTING
Information
Patent Application
Multispectral imaging chip using photonic crystals
Publication number
20060054780
Publication date
Mar 16, 2006
Raytheon Company
Dennis J. Garrood
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Low phase-noise local oscillator and method
Publication number
20050040902
Publication date
Feb 24, 2005
Michael R. Beylor
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
System and method for tracking beam-aspect targets with combined Ka...
Publication number
20050035900
Publication date
Feb 17, 2005
David A. Zaugg
G01 - MEASURING TESTING
Information
Patent Application
Electric field resonance assisted Raman scattering for ladar IFF
Publication number
20050024634
Publication date
Feb 3, 2005
Delmar L. Barker
G01 - MEASURING TESTING
Information
Patent Application
RADOME COMPENSATION USING MATCHED NEGATIVE INDEX OR REFRACTION MATE...
Publication number
20040169616
Publication date
Sep 2, 2004
Stephen M. Schultz
G02 - OPTICS
Information
Patent Application
System and method for detecting and estimating the direction of nea...
Publication number
20030189512
Publication date
Oct 9, 2003
Hai-Wai Chen
G01 - MEASURING TESTING