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Harry F. Prest
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Mountain View, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
In-situ conditioning in mass spectrometry systems
Patent number
10,580,632
Issue date
Mar 3, 2020
Agilent Technologies, Inc.
Harry F. Prest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Axial magnetic ion source and related ionization methods
Patent number
9,117,617
Issue date
Aug 25, 2015
Agilent Technologies, Inc.
Charles William Russ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In-situ conditioning in mass spectrometer systems
Patent number
8,513,593
Issue date
Aug 20, 2013
Agilent Technologies, Inc.
Bruce D. Quimby
G01 - MEASURING TESTING
Information
Patent Grant
In-situ conditioning in mass spectrometer systems
Patent number
8,378,293
Issue date
Feb 19, 2013
Agilent Technologies, Inc.
Bruce D. Quimby
G01 - MEASURING TESTING
Information
Patent Grant
Photoactivated collision induced dissociation (PACID) (apparatus an...
Patent number
7,816,644
Issue date
Oct 19, 2010
Agilent Technologies, Inc.
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses, methods and compositions for ionization of samples and...
Patent number
7,737,395
Issue date
Jun 15, 2010
Agilent Technologies, Inc.
Paul C. Goodley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
GC mass spectrometry interface and method
Patent number
7,569,815
Issue date
Aug 4, 2009
Agilent Technologies, Inc.
Harry F Prest
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic adjustment of ion monitoring periods
Patent number
7,482,580
Issue date
Jan 27, 2009
Agilent Technologies, Inc.
Harry F. Prest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of enhancing confidence in assays for analytes
Patent number
6,808,933
Issue date
Oct 26, 2004
Agilent Technologies, Inc.
Harry F. Prest
G01 - MEASURING TESTING
Information
Patent Grant
In Situ concentration of an analyte
Patent number
6,484,560
Issue date
Nov 26, 2002
Agilent Technologies, Inc.
Harry F. Prest
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IN-SITU CONDITIONING IN MASS SPECTROMETRY SYSTEMS
Publication number
20190189413
Publication date
Jun 20, 2019
Agilent Technologies, Inc.
Harry F. Prest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Ionization (EI) Utilizing Different EI Energies
Publication number
20180277348
Publication date
Sep 27, 2018
Agilent Technologies, Inc.
Harry F. Prest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS OF ANALYTE DERIVATIZATION AND ENHANCED SOFT IONIZATION
Publication number
20170089915
Publication date
Mar 30, 2017
Agilent Technologies, Inc.
Mingda Wang
G01 - MEASURING TESTING
Information
Patent Application
AXIAL MAGNETIC ION SOURCE AND RELATED IONIZATION METHODS
Publication number
20140375209
Publication date
Dec 25, 2014
Charles William Russ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON IONIZATION (EI) UTILIZING DIFFERENT EI ENERGIES
Publication number
20140374583
Publication date
Dec 25, 2014
Harry F. Prest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE INLET WITH MULTI-CAPILLARY LINER FOR GAS CHROMATOGRAPHY
Publication number
20140260540
Publication date
Sep 18, 2014
AGILENT TECHNOLOGIES, INC.
Gregory G. O'Neil
G01 - MEASURING TESTING
Information
Patent Application
IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS
Publication number
20130099113
Publication date
Apr 25, 2013
AGILENT TECHNOLOGIES, INC.
BRUCE D. QUIMBY
G01 - MEASURING TESTING
Information
Patent Application
IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS
Publication number
20130062515
Publication date
Mar 14, 2013
AGILENT TECHNOLOGIES, INC.
Bruce D. Quimby
G01 - MEASURING TESTING
Information
Patent Application
GC Mass Spectrometry Interface and Method
Publication number
20080142701
Publication date
Jun 19, 2008
Harry F. Prest
G01 - MEASURING TESTING
Information
Patent Application
Vacuum interface for mass spectrometer
Publication number
20080083874
Publication date
Apr 10, 2008
Harry F. Prest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUSES, METHODS AND COMPOSITIONS FOR IONIZATION OF SAMPLES AND...
Publication number
20080067336
Publication date
Mar 20, 2008
Paul C. Goodley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ionization of neutral gas-phase molecules and mass calibrants
Publication number
20080067356
Publication date
Mar 20, 2008
Paul C. Goodley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Photoactivated collision induced dissociation (PACID) (apparatus an...
Publication number
20080042056
Publication date
Feb 21, 2008
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Application
Interlocked hydrogen source for gas chromatography
Publication number
20070224693
Publication date
Sep 27, 2007
Harry F. Prest
G01 - MEASURING TESTING
Information
Patent Application
Dynamic adjustment of ion monitoring periods
Publication number
20070114374
Publication date
May 24, 2007
Harry F. Prest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and article for analyte concentration free of intermediate t...
Publication number
20060063268
Publication date
Mar 23, 2006
Harry F. Prest
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL