Harry Hai Chen

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for generating featured test pattern
- Patent number 10,067,186
- Issue date Sep 4, 2018
- Mediatek Inc.
- Harry Hai Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for generating featured scan pattern
- Patent number 9,465,071
- Issue date Oct 11, 2016
- Mediatek Inc.
- Harry Hai Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST METHOD AND TEST DEVICE FOR IDENTIFYING CRITICAL POINTS OF A CI...
- Publication number 20240345157
- Publication date Oct 17, 2024
- MEDIATEK INC.
- Harry Hai Chen
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT CELL-AWARE FAULT MODELING BY SWITCH-LEVEL TEST GENERATION
- Publication number 20180060472
- Publication date Mar 1, 2018
- MEDIATEK INC.
- Harry Hai Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING FEATURED TEST PATTERN
- Publication number 20160377678
- Publication date Dec 29, 2016
- MEDIATEK INC.
- Harry Hai Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING FEATURED SCAN PATTERN
- Publication number 20150253384
- Publication date Sep 10, 2015
- MEDIATEK INC.
- Harry Hai Chen
- G01 - MEASURING TESTING