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Harry Hai Chen
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Hsinchu City, TW
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for generating featured test pattern
Patent number
10,067,186
Issue date
Sep 4, 2018
Mediatek Inc.
Harry Hai Chen
G11 - INFORMATION STORAGE
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Patent Grant
Method and apparatus for generating featured scan pattern
Patent number
9,465,071
Issue date
Oct 11, 2016
Mediatek Inc.
Harry Hai Chen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS FOR GENERATING FEATURED TEST PATTERN
Publication number
20160377678
Publication date
Dec 29, 2016
MEDIATEK INC.
Harry Hai Chen
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING FEATURED SCAN PATTERN
Publication number
20150253384
Publication date
Sep 10, 2015
MEDIATEK INC.
Harry Hai Chen
G01 - MEASURING TESTING