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HARRY HOU
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SANTA CLARA, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring device, test device, electronic device, measuring method,...
Patent number
8,442,788
Issue date
May 14, 2013
Advantest Corporation
Harry Hou
G01 - MEASURING TESTING
Information
Patent Grant
Correcting apparatus, PDF measurement apparatus, jitter measurement...
Patent number
8,312,327
Issue date
Nov 13, 2012
Advantest Corporation
Harry Hou
G01 - MEASURING TESTING
Information
Patent Grant
Noise separating apparatus, noise separating method, probability de...
Patent number
8,121,815
Issue date
Feb 21, 2012
Advantest Corporation
Takahiro Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device, test device, electronic device, program, and reco...
Patent number
7,970,565
Issue date
Jun 28, 2011
Advantest Corporation
Harry Hou
G01 - MEASURING TESTING
Information
Patent Grant
Probability density function separating apparatus, probability dens...
Patent number
7,949,484
Issue date
May 24, 2011
Advantest Corporation
Takahiro Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Probability density function separating apparatus, probability dens...
Patent number
7,930,139
Issue date
Apr 19, 2011
Advantest Corporation
Takahiro Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus, testing apparatus, and electronic device
Patent number
7,856,330
Issue date
Dec 21, 2010
Advantest Corporation
Harry Hou
G01 - MEASURING TESTING
Information
Patent Grant
Probability density function separating apparatus, probability dens...
Patent number
7,856,463
Issue date
Dec 21, 2010
Advantest Corporation
Takahiro Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Testing a transceiver
Patent number
7,849,374
Issue date
Dec 7, 2010
LTX Corporation
R. Warren Necoechea
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Probability density function separating apparatus, probability dens...
Patent number
7,809,516
Issue date
Oct 5, 2010
Advantest Corporation
Takahiro Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus, measuring method, testing apparatus, testing m...
Patent number
7,421,355
Issue date
Sep 2, 2008
Advantest Corporation
Harry Hou
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
CORRECTING APPARATUS, PDF MEASUREMENT APPARATUS, JITTER MEASUREMENT...
Publication number
20100275072
Publication date
Oct 28, 2010
Advantest Corporation
HARRY HOU
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE, TEST DEVICE, ELECTRONIC DEVICE, MEASURING METHOD,...
Publication number
20100048142
Publication date
Feb 25, 2010
Advantest Corporation
HARRY HOU
G01 - MEASURING TESTING
Information
Patent Application
PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENS...
Publication number
20090326845
Publication date
Dec 31, 2009
Advantest Corporation
TAKAHIRO YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE, TEST DEVICE, ELECTRONIC DEVICE, PROGRAM, AND RECO...
Publication number
20090234604
Publication date
Sep 17, 2009
Advantest Corporation
HARRY HOU
G01 - MEASURING TESTING
Information
Patent Application
NOISE SEPARATING APPARATUS, NOISE SEPARATING METHOD, PROBABILITY DE...
Publication number
20090182530
Publication date
Jul 16, 2009
Advantest Corporation
TAKAHIRO YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENS...
Publication number
20090043537
Publication date
Feb 12, 2009
Advantest Corporation
TAKAHIRO YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENS...
Publication number
20080189064
Publication date
Aug 7, 2008
Advantest Corporation
TAKAHIRO YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENS...
Publication number
20080098055
Publication date
Apr 24, 2008
Takahiro YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
NOISE SEPARATING APPARATUS, NOISE SEPARATING METHOD, PROBABILITY DE...
Publication number
20080077357
Publication date
Mar 27, 2008
Advantest Corporation
TAKAHIRO YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS, TESTING APPARATUS, AND ELECTRONIC DEVICE
Publication number
20080040060
Publication date
Feb 14, 2008
Harry Hou
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS, MEASURING METHOD, TESTING APPARATUS, TESTING M...
Publication number
20070260947
Publication date
Nov 8, 2007
Harry Hou
G01 - MEASURING TESTING