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Harry Owen
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Ann Arbor, MI, US
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Patents Grants
last 30 patents
Information
Patent Grant
Large-collection-area raman probe with reduced background fluorescence
Patent number
8,675,190
Issue date
Mar 18, 2014
Kaiser Optical Systems
Harry Owen
G01 - MEASURING TESTING
Information
Patent Grant
Large-collection-area optical probe
Patent number
7,148,963
Issue date
Dec 12, 2006
Kaiser Optical Systems
Harry Owen
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectroscopy crystallization analysis method
Patent number
6,867,858
Issue date
Mar 15, 2005
Kaiser Optical Systems
Harry Owen
G01 - MEASURING TESTING
Information
Patent Grant
Spectrograph with multiplexing of different wavelength regions onto...
Patent number
5,559,597
Issue date
Sep 24, 1996
Kaiser Optical Systems, Inc.
David E. Battey
G01 - MEASURING TESTING
Information
Patent Grant
Holographic transmission bandpass filter
Patent number
5,530,565
Issue date
Jun 25, 1996
Kaiser Optical Systems, Inc.
Harry Owen
G02 - OPTICS
Information
Patent Grant
Spectrograph with multiplexing of different wavelength regions onto...
Patent number
5,442,439
Issue date
Aug 15, 1995
Kaiser Optical Systems, Inc.
David E. Battey
G01 - MEASURING TESTING
Information
Patent Grant
Remote optical measurement probe
Patent number
5,377,004
Issue date
Dec 27, 1994
Kaiser Optical Systems
Harry Owen
G02 - OPTICS
Information
Patent Grant
Detection system for Raman scattering employing holographic diffrac...
Patent number
5,011,284
Issue date
Apr 30, 1991
Kaiser Optical Systems
James M. Tedesco
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
LARGE-COLLECTION-AREA RAMAN PROBE WITH REDUCED BACKGROUND FLUORESCENCE
Publication number
20120300201
Publication date
Nov 29, 2012
Kaiser Optical Systems
Harry Owen
G01 - MEASURING TESTING
Information
Patent Application
Large-collection-area optical probe
Publication number
20050140973
Publication date
Jun 30, 2005
Harry Owen
G01 - MEASURING TESTING
Information
Patent Application
Raman spectroscopy crystallization analysis method
Publication number
20040004714
Publication date
Jan 8, 2004
Harry Owen
G01 - MEASURING TESTING