Harry R. Fair III

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Arlington, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Fault tolerant scannable glitch latch
- Patent number 8,850,278
- Issue date Sep 30, 2014
- Advanced Micro Devices, Inc.
- Kevin M. Gillespie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAULT TOLERANT SCANNABLE GLITCH LATCH
- Publication number 20120166899
- Publication date Jun 28, 2012
- Advanced Micro Devices, Inc.
- Kevin M. Gillespie
- G01 - MEASURING TESTING
Information Patent Application
Partial address compares stored in translation lookaside buffer
- Publication number 20050198466
- Publication date Sep 8, 2005
- Michael D. Estlick
- G06 - COMPUTING CALCULATING COUNTING