Harsanjeet Singh

Follow

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Implementing edit and update functionality within a development env...
- Patent number 9,785,542
- Issue date Oct 10, 2017
- Advantest Corporation
- Mark Elston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using shared pins in a concurrent test execution environment
- Patent number 9,274,911
- Issue date Mar 1, 2016
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 8,255,198
- Issue date Aug 28, 2012
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 7,209,851
- Issue date Apr 24, 2007
- Advantest America R&D Center, Inc.
- Harsanjeet Singh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENV...
- Publication number 20140310693
- Publication date Oct 16, 2014
- Advantest Corporation
- Mark ELSTON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT
- Publication number 20140237291
- Publication date Aug 21, 2014
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Application
Method and Structure to Develop a Test Program for Semiconductor In...
- Publication number 20100192135
- Publication date Jul 29, 2010
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20050154550
- Publication date Jul 14, 2005
- Advantest America R&D Center, Inc.
- Harsanjeet Singh
- G01 - MEASURING TESTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20040225459
- Publication date Nov 11, 2004
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING