Hartmut Neckel

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Heidelberg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for (trace) gas analysis
- Patent number 5,002,391
- Issue date Mar 26, 1991
- Mutek-Laser und optoelectronische Gerate GmbH
- Jurgen Wolfrum
- G01 - MEASURING TESTING