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Haruhiko Abe

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  • Kawasaki, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Delay failure test circuit
    • Patent number 7,640,124
    • Issue date Dec 29, 2009
    • Fujitsu Microelectronics Limited
    • Hideaki Konishi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Delay failure test circuit
    • Publication number 20070288184
    • Publication date Dec 13, 2007
    • FUJITSU LIMITED
    • Hideaki Konishi
    • G01 - MEASURING TESTING