Haruhiko Hatano

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and control method thereof
- Patent number 10,784,074
- Issue date Sep 22, 2020
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anti-contamination trap, and vacuum application device
- Patent number 10,269,533
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Takashi Mizuo
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Electron microscope sample holder and sample observation method
- Patent number 9,159,530
- Issue date Oct 13, 2015
- Hitachi High-Technologies Corporation
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,921,784
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Toru Iwaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,766,184
- Issue date Jul 1, 2014
- Hitachi High-Technologies Corporation
- Haruhiko Hatano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20180350554
- Publication date Dec 6, 2018
- Hitachi High-Technologies Corporation
- Takeshi SUNAOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Anti-Contamination Trap, and Vacuum Application Device
- Publication number 20160203940
- Publication date Jul 14, 2016
- Hitachi High-Technologies Corporation
- Takashi MIZUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE SAMPLE HOLDER AND SAMPLE OBSERVATION METHOD
- Publication number 20140014835
- Publication date Jan 16, 2014
- Hitachi High-Technologies Corporation
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130284923
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Haruhiko Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120211654
- Publication date Aug 23, 2012
- Hitachi High-Technologies Corporation
- Toru Iwaya
- H01 - BASIC ELECTRIC ELEMENTS