Haruhiko Kobayashi

Person

  • Tokyo-to, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Position detection surveying device

    • Patent number 6,046,800
    • Issue date Apr 4, 2000
    • Kabushiki Kaisha Topcon
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument

    • Patent number 5,767,952
    • Issue date Jun 16, 1998
    • Kabushiki Kaisha TOPCON
    • Fumio Ohtomo
    • G01 - MEASURING TESTING