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Haruhiro Hasegawa
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Kokubunji, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Nuclear magnetic resonance spectrometer
Patent number
7,639,014
Issue date
Dec 29, 2009
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance probe coil
Patent number
7,352,186
Issue date
Apr 1, 2008
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance apparatus
Patent number
7,173,424
Issue date
Feb 6, 2007
Hitachi, Ltd.
Kazuo Saitoh
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance probe coil
Patent number
7,164,269
Issue date
Jan 16, 2007
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
NMR spectrometer and NMR probe
Patent number
7,138,801
Issue date
Nov 21, 2006
Hitachi, Ltd.
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Decimation filter and signal processing method using the same
Patent number
6,725,248
Issue date
Apr 20, 2004
Hitachi, Ltd.
Haruhiro Hasegawa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Superconductive single flux quantum logic circuit
Patent number
6,310,488
Issue date
Oct 30, 2001
Hitachi, Ltd.
Haruhiro Hasegawa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Superconducting device
Patent number
5,550,389
Issue date
Aug 27, 1996
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming a superconducting weak link device
Patent number
5,468,723
Issue date
Nov 21, 1995
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconducting device having superconducting weak coupling
Patent number
5,334,580
Issue date
Aug 2, 1994
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconducting field effect transistor
Patent number
5,317,168
Issue date
May 31, 1994
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Oxide superconducting device
Patent number
5,256,897
Issue date
Oct 26, 1993
Hitachi, Ltd.
Haruhiro Hasegawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconductive switching element with semiconductor channel
Patent number
5,250,506
Issue date
Oct 5, 1993
Hitachi, Ltd.
Shinichiroh Saitoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High T.sub.c superconducting device with weak link between two supe...
Patent number
5,232,905
Issue date
Aug 3, 1993
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for controlling oxygen content of superconductive oxide, su...
Patent number
5,096,882
Issue date
Mar 17, 1992
Hitachi, Ltd.
Takahiko Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flux method of growing oxide superconductors
Patent number
4,921,834
Issue date
May 1, 1990
Hitachi, Ltd.
Haruhiro Hasegawa
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Grant
Magnetometer using a Josephson device and superconducting phototran...
Patent number
4,906,930
Issue date
Mar 6, 1990
Hitachi, Ltd.
Hideaki Nakane
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Nuclear magnetic resonance spectrometer
Publication number
20080252294
Publication date
Oct 16, 2008
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
NMR spectrometer
Publication number
20080231277
Publication date
Sep 25, 2008
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of superconducting magnesium diboride thin fil...
Publication number
20080064605
Publication date
Mar 13, 2008
Hitachi, Ltd.
Hiroyuki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nuclear Magnetic resonance probe coil
Publication number
20070273379
Publication date
Nov 29, 2007
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
Nuclear magnetic resonance probe coil
Publication number
20060119359
Publication date
Jun 8, 2006
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
NMR spectrometer and NMR probe
Publication number
20060119360
Publication date
Jun 8, 2006
Hitachi, Ltd.
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Nuclear magnetic resonance apparatus
Publication number
20060033498
Publication date
Feb 16, 2006
Kazuo Saitoh
G01 - MEASURING TESTING