Haruhisa Takahata

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Naka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Environmental scanning electron microcope
- Patent number 7,365,323
- Issue date Apr 29, 2008
- Hitachi High-Technologies Corporation
- Tomohisa Ohtaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Environmental scanning electron microscope
- Publication number 20060219912
- Publication date Oct 5, 2006
- Hitachi High-Technologies Corporation
- Tomohisa Ohtaki
- G01 - MEASURING TESTING