Haruki Nakagawa

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of measurement by scanning tunneling microscope
- Patent number 4,902,892
- Issue date Feb 20, 1990
- Agency of Industrial Science and Technology, Kosaka Laboratory Ltd.
- Shigeo Okayama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for determining the location of points on a th...
- Patent number 4,430,796
- Issue date Feb 14, 1984
- Kosaka Laboratory Ltd.
- Haruki Nakagawa
- G01 - MEASURING TESTING