Haruko AKUTSU

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 11,062,894
- Issue date Jul 13, 2021
- Kabushiki Kaisha Toshiba
- Reiko Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
- Patent number 10,916,405
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer performing mass spectrometry for sample with lase...
- Patent number 10,553,416
- Issue date Feb 4, 2020
- Toshiba Memory Corproation
- Haruko Akutsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope and measurement method using the same
- Patent number 10,345,336
- Issue date Jul 9, 2019
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Analytical apparatus, sample holder and analytical method
- Patent number 9,734,985
- Issue date Aug 15, 2017
- Kabushiki Kaisha Toshiba
- Haruko Akutsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sputter neutral particle mass spectrometry apparatus with optical e...
- Patent number 9,431,229
- Issue date Aug 30, 2016
- Kabushiki Kaisha Toshiba
- Toma Yorisaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material inspection apparatus and material inspection method
- Patent number 9,287,104
- Issue date Mar 15, 2016
- Kabushiki Kaisha Toshiba
- Haruko Akutsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample structure analyzing method, transmission electron microscope...
- Patent number 8,841,614
- Issue date Sep 23, 2014
- Kabushiki Kaisha Toshiba
- Takeshi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzing apparatus and sample analyzing method
- Patent number 8,748,844
- Issue date Jun 10, 2014
- Kabushiki Kaisha Toshiba
- Haruko Akutsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacture of semiconductor device
- Patent number 7,557,040
- Issue date Jul 7, 2009
- Kabushiki Kaisha Toshiba
- Hiroshi Itokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 7,495,293
- Issue date Feb 24, 2009
- Kabushiki Kaisha Toshiba
- Toshihiko Iinuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for evaluating semiconductor material
- Patent number 7,145,658
- Issue date Dec 5, 2006
- Kabushiki Kaisha Toshiba
- Haruko Akutsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
- Publication number 20200286711
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20190341242
- Publication date Nov 7, 2019
- KABUSHIKI KAISHA TOSHIBA
- Reiko SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20170269123
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20170076930
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Haruko AKUTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL APPARATUS, SAMPLE HOLDER AND ANALYTICAL METHOD
- Publication number 20170004954
- Publication date Jan 5, 2017
- KABUSHIKI KAISHA TOSHIBA
- Haruko AKUTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROSCOPE AND MASS SPECTROMETRY
- Publication number 20150279645
- Publication date Oct 1, 2015
- KABUSHIKI KAISHA TOSHIBA
- Haruko AKUTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPUTTER NEUTRAL PARTICLE MASS SPECTROMETRY APPARATUS
- Publication number 20150270113
- Publication date Sep 24, 2015
- KABUSHIKI KAISHA TOSHIBA
- Toma YORISAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATERIAL INSPECTION APPARATUS AND MATERIAL INSPECTION METHOD
- Publication number 20150048244
- Publication date Feb 19, 2015
- Kabushiki Kaisha Toshiba
- Haruko AKUTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATERIAL INSPECTION APPARATUS
- Publication number 20150041652
- Publication date Feb 12, 2015
- Kabushiki Kaisha Toshiba
- Haruko AKUTSU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS APPARATUS, NON-TRANSITORY COMPUTER-READABLE RECORDI...
- Publication number 20150012229
- Publication date Jan 8, 2015
- Kabushiki Kaisha Toshiba
- Masayuki SHISHIDO
- G01 - MEASURING TESTING
Information Patent Application
ATOM PROBE MEASURING APPARATUS AND METHOD
- Publication number 20140070110
- Publication date Mar 13, 2014
- Katsuyuki KITAMOTO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZING APPARATUS AND SAMPLE ANALYZING METHOD
- Publication number 20130248706
- Publication date Sep 26, 2013
- Haruko AKUTSU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CLEANING MASK AND MASK CLEANING APPARATUS
- Publication number 20110100393
- Publication date May 5, 2011
- Eri UEMURA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE FABRICATION MASK AND METHOD OF MANUFACTURING T...
- Publication number 20110053058
- Publication date Mar 3, 2011
- Kyo OTSUBO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20090243002
- Publication date Oct 1, 2009
- Kabushiki Kaisha Toshiba
- Takeshi SONEHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacture of semiconductor device
- Publication number 20070166977
- Publication date Jul 19, 2007
- Hiroshi Itokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20070052039
- Publication date Mar 8, 2007
- Toshihiko Iinuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for evaluating semiconductor material
- Publication number 20040196464
- Publication date Oct 7, 2004
- Haruko Akutsu
- G01 - MEASURING TESTING

Haruko AKUTSU

Person

Patents Grantslast 30 patents

Mass spectrometer and mass spectrometry method

Atom probe inspection device, field ion microscope, and distortion...

Mass spectrometer performing mass spectrometry for sample with lase...

Scanning probe microscope and measurement method using the same

Analytical apparatus, sample holder and analytical method

Sputter neutral particle mass spectrometry apparatus with optical e...

Material inspection apparatus and material inspection method

Sample structure analyzing method, transmission electron microscope...

Sample analyzing apparatus and sample analyzing method

Method of manufacture of semiconductor device

Semiconductor device and method for manufacturing the same

Apparatus and method for evaluating semiconductor material

Patents Applicationslast 30 patents

ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD USING THE SAME

MASS SPECTROMETER

ANALYTICAL APPARATUS, SAMPLE HOLDER AND ANALYTICAL METHOD

MASS SPECTROSCOPE AND MASS SPECTROMETRY

SPUTTER NEUTRAL PARTICLE MASS SPECTROMETRY APPARATUS

MATERIAL INSPECTION APPARATUS AND MATERIAL INSPECTION METHOD

MATERIAL INSPECTION APPARATUS

SAMPLE ANALYSIS APPARATUS, NON-TRANSITORY COMPUTER-READABLE RECORDI...

ATOM PROBE MEASURING APPARATUS AND METHOD

SAMPLE ANALYZING APPARATUS AND SAMPLE ANALYZING METHOD

METHOD OF CLEANING MASK AND MASK CLEANING APPARATUS

SEMICONDUCTOR DEVICE FABRICATION MASK AND METHOD OF MANUFACTURING T...

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

Method of manufacture of semiconductor device

Semiconductor device and method for manufacturing the same

Apparatus and method for evaluating semiconductor material