Harumi Maruyama

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 8,324,568
- Issue date Dec 4, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry and mass spectrometer used for the same
- Patent number 8,309,917
- Issue date Nov 13, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Internal standard material, resin composition, and measurement method
- Patent number 8,164,051
- Issue date Apr 24, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Mass spectrometer system and mass spectrometry method
- Patent number 8,049,166
- Issue date Nov 1, 2011
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 7,952,069
- Issue date May 31, 2011
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry apparatus
- Patent number 7,202,474
- Issue date Apr 10, 2007
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry apparatus
- Patent number 7,084,397
- Issue date Aug 1, 2006
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20100243884
- Publication date Sep 30, 2010
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER SYSTEM AND MASS SPECTROMETRY METHOD
- Publication number 20100163723
- Publication date Jul 1, 2010
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME
- Publication number 20100163722
- Publication date Jul 1, 2010
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20090272894
- Publication date Nov 5, 2009
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERNAL STANDARD MATERIAL, RESIN COMPOSITION, AND MEASUREMENT METHOD
- Publication number 20090266981
- Publication date Oct 29, 2009
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Ion Attachment Mass Spectrometry Apparatus
- Publication number 20060169888
- Publication date Aug 3, 2006
- ANELVA CORPORATION
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion attachment mass spectrometry apparatus
- Publication number 20040251408
- Publication date Dec 16, 2004
- ANELVA CORPORATION
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS

Harumi Maruyama

Person

Patents Grantslast 30 patents

Mass spectrometer and mass spectrometry method

Mass spectrometry and mass spectrometer used for the same

Internal standard material, resin composition, and measurement method

Mass spectrometer system and mass spectrometry method

Mass spectrometer and mass spectrometry method

Ion attachment mass spectrometry apparatus

Ion attachment mass spectrometry apparatus

Patents Applicationslast 30 patents

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

MASS SPECTROMETER SYSTEM AND MASS SPECTROMETRY METHOD

MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

INTERNAL STANDARD MATERIAL, RESIN COMPOSITION, AND MEASUREMENT METHOD

Ion Attachment Mass Spectrometry Apparatus

Ion attachment mass spectrometry apparatus