Haruo MIYADERA

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged-particle trajectory measurement apparatus and charged-parti...
- Patent number 11,977,192
- Issue date May 7, 2024
- Kabushiki Kaisha Toshiba
- Naoto Kume
- G01 - MEASURING TESTING
Information Patent Grant
Muon tracker and muon tracking method
- Patent number 9,720,113
- Issue date Aug 1, 2017
- Kabushiki Kaisha Toshiba
- Kohichi Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner image generating apparatus and method thereof
- Patent number 9,423,361
- Issue date Aug 23, 2016
- Kabushiki Kaisha Toshiba
- Tsukasa Sugita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE TRAJECTORY MEASUREMENT APPARATUS AND CHARGED-PARTI...
- Publication number 20230029942
- Publication date Feb 2, 2023
- Kabushiki Kaisha Toshiba
- Naoto KUME
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MEASUREMENT APPARATUS AND CONTROL METHOD OF CHARGE...
- Publication number 20230026295
- Publication date Jan 26, 2023
- Kabushiki Kaisha Toshiba
- Naoto KUME
- G01 - MEASURING TESTING
Information Patent Application
MUON TRACKER AND MUON TRACKING METHOD
- Publication number 20160377747
- Publication date Dec 29, 2016
- KABUSHIKI KAISHA TOSHIBA
- Kohichi NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
INNER IMAGE GENERATING APPARATUS AND METHOD THEREOF
- Publication number 20150198542
- Publication date Jul 16, 2015
- KABUSHIKI KAISHA TOSHIBA
- Tsukasa SUGITA
- G01 - MEASURING TESTING