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Haruo Shimaoka
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Fine bubble elimination method and fine bubble elimination device,...
Patent number
11,898,949
Issue date
Feb 13, 2024
Shimadzu Corporation
Seika Ohuchi
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution measuring apparatus
Patent number
9,261,448
Issue date
Feb 16, 2016
Shimadzu Corporation
Haruo Shimaoka
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for evaluating dielectrophoretic intensity of...
Patent number
8,313,628
Issue date
Nov 20, 2012
Shimadzu Corporation
Yoshio Tsunazawa
B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information
Patent Grant
Method and apparatus for measuring suspended particulate matter
Patent number
6,674,528
Issue date
Jan 6, 2004
Shimadzu Corporation
Motoaki Adachi
G01 - MEASURING TESTING
Information
Patent Grant
Method of monitoring microbe in water
Patent number
6,650,414
Issue date
Nov 18, 2003
Shimadzu Corporation
Haruo Shimaoka
G01 - MEASURING TESTING
Information
Patent Grant
Particle size analyzer based on laser diffraction method
Patent number
6,473,178
Issue date
Oct 29, 2002
Shimadzu Corporation
Haruo Shimaoka
G01 - MEASURING TESTING
Information
Patent Grant
Particle size analyzer based on the laser diffraction method
Patent number
6,469,786
Issue date
Oct 22, 2002
Shimadzu Corporation
Haruo Shimaoka
G01 - MEASURING TESTING
Information
Patent Grant
Particle size analyzer based on laser diffraction method
Patent number
6,417,920
Issue date
Jul 9, 2002
Shimadzu Corporation
Haruo Shimaoka
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for estimating a mixing proportion of differen...
Patent number
5,400,139
Issue date
Mar 21, 1995
Shimadzu Corporation
Haruo Shimaoka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FINE BUBBLE SUPPLY DEVICE, AND FINE BUBBLE ANALYZING SYSTEM
Publication number
20200376448
Publication date
Dec 3, 2020
Shimadzu Corporation
Seika OHUCHI
G01 - MEASURING TESTING
Information
Patent Application
FINE BUBBLE ELIMINATION METHOD AND FINE BUBBLE ELIMINATION DEVICE,...
Publication number
20200340898
Publication date
Oct 29, 2020
Shimadzu Corporation
Seika OHUCHI
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE SIZE DISTRIBUTION MEASURING APPARATUS
Publication number
20150377761
Publication date
Dec 31, 2015
SHIMADZU CORPORATION
Haruo SHIMAOKA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EVALUATING DIELECTROPHORETIC INTENSITY OF...
Publication number
20100012496
Publication date
Jan 21, 2010
Yoshio Tsunazawa
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring suspended particulate matter
Publication number
20030016356
Publication date
Jan 23, 2003
Shimadzu Corporation
Motoaki Adachi
G01 - MEASURING TESTING
Information
Patent Application
Particle size analyzer based on laser diffraction method
Publication number
20020101590
Publication date
Aug 1, 2002
Haruo Shimaoka
G01 - MEASURING TESTING
Information
Patent Application
Particle size analyzer based on the laser diffraction method
Publication number
20020036776
Publication date
Mar 28, 2002
SHIMADZU CORPORATION
Haruo Shimaoka
G01 - MEASURING TESTING