Haruo Tajima

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Patents Grantslast 30 patents

Information Patent Grant
Sample chip analyzing device and method for analyzing the same
- Patent number 6,787,364
- Issue date Sep 7, 2004
- Nippon Laser & Electronics Lab.
- Haruo Tajima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sample chip analyzing device and method for analyzing the same
- Publication number 20020003623
- Publication date Jan 10, 2002
- NIPPON LASER & ELECTRONICS LAB.
- Haruo Tajima
- G01 - MEASURING TESTING