Haruo Takahashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus and x-ray inspection method
- Patent number 10,989,674
- Issue date Apr 27, 2021
- Hitachi High-Tech Science Corporation
- Masaki Tatsumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generator and fluorescent X-ray analyzer
- Patent number 9,721,749
- Issue date Aug 1, 2017
- Hitachi High-Tech Science Corporation
- Ryusuke Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 9,612,214
- Issue date Apr 4, 2017
- Hitachi High-Tech Science Corporation
- Haruo Takahashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray fluorescence spectrometer comprising a temperature sensor, tw...
- Patent number 9,410,906
- Issue date Aug 9, 2016
- Hitachi High-Tech Science Corporation
- Ryusuke Hirose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Composite charged particle beam apparatus and sample processing and...
- Patent number 8,642,958
- Issue date Feb 4, 2014
- SII NanoTechnology Inc.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for cross-section processing and observation
- Patent number 8,542,275
- Issue date Sep 24, 2013
- SII NanoTechnology Inc.
- Masahiro Kiyohara
- G01 - MEASURING TESTING
Information Patent Grant
Sample preparing device and sample posture shifting method
- Patent number 8,198,603
- Issue date Jun 12, 2012
- SII NanoTechnology Inc.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus, method of processing a s...
- Patent number 7,973,280
- Issue date Jul 5, 2011
- SII NanoTechnology Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for working and observing samples and method of working a...
- Patent number 7,755,044
- Issue date Jul 13, 2010
- Sii Nano Technology Inc.
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Composite charged-particle beam system
- Patent number 7,718,981
- Issue date May 18, 2010
- SII NanoTechnology Inc.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing apparatus using focused charged particle beam
- Patent number 7,518,125
- Issue date Apr 14, 2009
- SII NanoTechnology Inc.
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,442,942
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Energy dispersive X-ray analyzer
- Patent number 6,563,902
- Issue date May 13, 2003
- Seiko Instruments Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray spectroscope
- Patent number 6,154,517
- Issue date Nov 28, 2000
- Seiko Instruments, Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of finding the center of a band-shaped region
- Patent number 5,425,066
- Issue date Jun 13, 1995
- Seiko Instruments Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Flyback transformer
- Patent number 4,156,888
- Issue date May 29, 1979
- Denki Onkyo Co., Ltd.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20200284738
- Publication date Sep 10, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masaki Tatsumi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
X-RAY GENERATOR AND FLUORESCENT X-RAY ANALYZER
- Publication number 20160118215
- Publication date Apr 28, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryusuke HIROSE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20150362445
- Publication date Dec 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Haruo TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Spectrometer
- Publication number 20140294145
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryusuke Hirose
- G01 - MEASURING TESTING

Haruo Takahashi

Person

Patents Grantslast 30 patents

X-ray inspection apparatus and x-ray inspection method

X-ray generator and fluorescent X-ray analyzer

X-ray fluorescence analyzer

X-ray fluorescence spectrometer comprising a temperature sensor, tw...

Composite charged particle beam apparatus and sample processing and...

Method and apparatus for cross-section processing and observation

Sample preparing device and sample posture shifting method

Composite charged particle beam apparatus, method of processing a s...

Apparatus for working and observing samples and method of working a...

Composite charged-particle beam system

Processing apparatus using focused charged particle beam

Charged particle beam apparatus

Energy dispersive X-ray analyzer

Fluorescent X-ray spectroscope

Method of finding the center of a band-shaped region

Flyback transformer

Patents Applicationslast 30 patents

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

X-RAY GENERATOR AND FLUORESCENT X-RAY ANALYZER

X-RAY FLUORESCENCE ANALYZER

X-Ray Fluorescence Spectrometer