Haruo Takahashi

Person

Chiba-shi, JP

People

Patents Applicationslast 30 patents

Information Patent Application
Composite charged particle beam apparatus and sample processing and...
- Publication number 20110226947
- Publication date Sep 22, 2011
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATION
- Publication number 20110063431
- Publication date Mar 17, 2011
- Masahiro KIYOHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATION
- Publication number 20110052044
- Publication date Mar 3, 2011
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Composite charged particle beam apparatus, method of processing a s...
- Publication number 20090206254
- Publication date Aug 20, 2009
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Sample preparing device and sample posture shifting method
- Publication number 20090114842
- Publication date May 7, 2009
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20080315088
- Publication date Dec 25, 2008
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR WORKING AND OBSERVING SAMPLES AND METHOD OF WORKING A...
- Publication number 20080224198
- Publication date Sep 18, 2008
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20070045560
- Publication date Mar 1, 2007
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Processing apparatus using focused charged particle beam
- Publication number 20070040128
- Publication date Feb 22, 2007
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Energy dispersive X-ray analyzer
- Publication number 20020009177
- Publication date Jan 24, 2002
- Haruo Takahashi
- G01 - MEASURING TESTING

Haruo Takahashi

Person

Patents Applicationslast 30 patents

Composite charged particle beam apparatus and sample processing and...

METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATION

METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATION

Composite charged particle beam apparatus, method of processing a s...

Sample preparing device and sample posture shifting method

COMPOSITE CHARGED-PARTICLE BEAM SYSTEM

APPARATUS FOR WORKING AND OBSERVING SAMPLES AND METHOD OF WORKING A...

Charged particle beam apparatus

Processing apparatus using focused charged particle beam

Energy dispersive X-ray analyzer