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Thermogravimetric instrument
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Patent number 6,057,516
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Issue date May 2, 2000
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Seiko Instruments, Inc.
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Toshihiko Nakamura
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G01 - MEASURING TESTING
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Thermal analysis apparatus
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Patent number 5,013,159
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Issue date May 7, 1991
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Seiko Instruments, Inc.
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Nobutaka Nakamura
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G01 - MEASURING TESTING
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High-resolution A/D converter
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Patent number 4,734,678
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Issue date Mar 29, 1988
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Seiko Instruments Inc.
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Masafumi Take
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H03 - BASIC ELECTRONIC CIRCUITRY