Haruo Yoda

Person

Hinoda, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Object information acquiring apparatus, information processing appa...
- Patent number 10,426,352
- Issue date Oct 1, 2019
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Object information acquiring apparatus and method of controlling same
- Patent number 9,924,876
- Issue date Mar 27, 2018
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Object information acquiring apparatus
- Patent number 9,664,782
- Issue date May 30, 2017
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing circuit and ultrasonic diagnostic apparatus
- Patent number 9,390,068
- Issue date Jul 12, 2016
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Grant
Object information acquiring apparatus
- Patent number 9,364,152
- Issue date Jun 14, 2016
- Canon Kabushiki Kaisha
- Katsuya Oikawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Received data processing apparatus of photoacoustic tomography
- Patent number 9,247,923
- Issue date Feb 2, 2016
- Canon Kabushiki Kaisha
- Yoshitaka Baba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measurement apparatus, movement control method, and program
- Patent number 9,247,881
- Issue date Feb 2, 2016
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ultrasonic imaging apparatus and method of controlling delay
- Patent number 9,165,552
- Issue date Oct 20, 2015
- Canon Kabushiki Kaisha
- Katsuya Oikawa
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Measuring apparatus
- Patent number 9,116,225
- Issue date Aug 25, 2015
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Object information acquiring apparatus
- Patent number 9,063,220
- Issue date Jun 23, 2015
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Grant
Acoustic wave imaging apparatus and acoustic wave imaging method
- Patent number 8,929,174
- Issue date Jan 6, 2015
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Grant
Photoacoustic imaging apparatus
- Patent number 8,920,321
- Issue date Dec 30, 2014
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Charged particle beam exposure apparatus
- Patent number 8,692,218
- Issue date Apr 8, 2014
- Canon Kabushiki Kaisha
- Masato Muraki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam apparatus and method of generating an electron beam i...
- Patent number 8,008,622
- Issue date Aug 30, 2011
- Hitachi High-Technologies Corporation
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,952,074
- Issue date May 31, 2011
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimation of probe shape in charged particle beam instr...
- Patent number 7,915,582
- Issue date Mar 29, 2011
- Hitachi High-Technologies Corporation
- Kotoko Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam exposure apparatus
- Patent number 7,692,166
- Issue date Apr 6, 2010
- Canon Kabushiki Kaisha
- Masato Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,642,514
- Issue date Jan 5, 2010
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam apparatus and method of generating an electron beam i...
- Patent number 7,635,851
- Issue date Dec 22, 2009
- Hitachi High-Technologies Corporation
- Ryo Fujita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam drawing apparatus
- Patent number 7,608,844
- Issue date Oct 27, 2009
- Hitachi High-Technologies Corporation
- Yuji Inoue
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,417,444
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,329,868
- Issue date Feb 12, 2008
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection system
- Patent number 7,235,782
- Issue date Jun 26, 2007
- Hitachi, Ltd.
- Atsushi Takane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron beam exposure method and apparatus
- Patent number 7,126,140
- Issue date Oct 24, 2006
- Hitachi, Ltd.
- Haruo Yoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,109,485
- Issue date Sep 19, 2006
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of charged particle beam lithography and equipment for charg...
- Patent number 7,105,842
- Issue date Sep 12, 2006
- Hitachi High-Technologies Corporation
- Sayaka Tanimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Statistic calculating method using a template and corresponding sub...
- Patent number 7,082,224
- Issue date Jul 25, 2006
- Hitachi, Ltd.
- Mitsuji Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-electron beam exposure method and apparatus
- Patent number 7,067,830
- Issue date Jun 27, 2006
- Hitachi, Ltd.
- Haruo Yoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam exposure method, charged particle beam exposu...
- Patent number 7,049,610
- Issue date May 23, 2006
- Canon Kabushiki Kaisha
- Masato Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Exposure apparatus and exposure method
- Patent number 7,039,487
- Issue date May 2, 2006
- Hitachi, Ltd.
- Koji Nagata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SUBJECT INFORMATION ACQUISITION APPARATUS
- Publication number 20190069874
- Publication date Mar 7, 2019
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RECEIVED DATA PROCESSING APPARATUS OF PHOTOACOUSTIC TOMOGRAPHY
- Publication number 20160174850
- Publication date Jun 23, 2016
- Canon Kabushiki Kaisha
- Yoshitaka Baba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OBJECT INFORMATION ACQUIRING APPARATUS AND METHOD OF CONTROLLING SAME
- Publication number 20140296689
- Publication date Oct 2, 2014
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OBJECT INFORMATION ACQUIRING APPARATUS
- Publication number 20140269190
- Publication date Sep 18, 2014
- Cannon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Application
OBJECT INFORMATION ACQUIRING APPARATUS, INFORMATION PROCESSING APPA...
- Publication number 20140058262
- Publication date Feb 27, 2014
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING CIRCUIT AND ULTRASONIC DIAGNOSTIC APPARATUS
- Publication number 20140052765
- Publication date Feb 20, 2014
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Application
OBJECT INFORMATION ACQUIRING APPARATUS
- Publication number 20140051970
- Publication date Feb 20, 2014
- Canon Kabushiki Kaisha
- Hisafumi Ebisawa
- G01 - MEASURING TESTING
Information Patent Application
OBJECT INFORMATION ACQUIRING APPARATUS
- Publication number 20140043941
- Publication date Feb 13, 2014
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Application
OBJECT INFORMATION ACQUIRING APPARATUS
- Publication number 20130308850
- Publication date Nov 21, 2013
- Canon Kabushiki Kaisha
- Katsuya Oikawa
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC WAVE IMAGING APPARATUS AND ACOUSTIC WAVE IMAGING METHOD
- Publication number 20120314534
- Publication date Dec 13, 2012
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Application
SUBJECT INFORMATION ACQUISITION APPARATUS
- Publication number 20120302864
- Publication date Nov 29, 2012
- Canon Kabushiki Kaisha
- Haruo Yoda
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC IMAGING APPARATUS AND METHOD OF CONTROLLING DELAY
- Publication number 20120281902
- Publication date Nov 8, 2012
- Canon Kabushiki Kaisha
- Katsuya Oikawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MOVEMENT CONTROL METHOD, AND PROGRAM
- Publication number 20120257472
- Publication date Oct 11, 2012
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASURING APPARATUS
- Publication number 20120044785
- Publication date Feb 23, 2012
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CHARGED PARTICLE BEAM INSTRUMENT COMPRISING AN ABERRATION CORRECTOR
- Publication number 20110210248
- Publication date Sep 1, 2011
- Hitachi High-Technologies Corporation
- Kotoko HIROSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECEIVED DATA PROCESSING APPARATUS OF PHOTOACOUSTIC TOMOGRAPHY
- Publication number 20110128816
- Publication date Jun 2, 2011
- Canon Kabushiki Kaisha
- Yoshitaka Baba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PHOTOACOUSTIC IMAGING APPARATUS
- Publication number 20110098550
- Publication date Apr 28, 2011
- Canon Kabushiki Kaisha
- Haruo Yoda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR ESTIMATION OF PROBE SHAPE IN CHARGED PARTICLE BEAM INSTR...
- Publication number 20100264309
- Publication date Oct 21, 2010
- Kotoko HIROSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus And Method Of Generating An Electron Beam I...
- Publication number 20100078555
- Publication date Apr 1, 2010
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron Beam Apparatus And Method of Generating An Electron Beam I...
- Publication number 20100078556
- Publication date Apr 1, 2010
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN
- Publication number 20080302964
- Publication date Dec 11, 2008
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20080116376
- Publication date May 22, 2008
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM EXPOSURE APPARATUS
- Publication number 20080067402
- Publication date Mar 20, 2008
- Masato Muraki
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE BEAM EXPOSURE APPARATUS
- Publication number 20080067403
- Publication date Mar 20, 2008
- Masato Muraki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Semiconductor inspection system
- Publication number 20070194236
- Publication date Aug 23, 2007
- Atsushi Takane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and method of generating an electron beam i...
- Publication number 20070057200
- Publication date Mar 15, 2007
- Ryo Fujita
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged particle beam apparatus
- Publication number 20070023657
- Publication date Feb 1, 2007
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20060043982
- Publication date Mar 2, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Electron-beam drawing apparatus and electron-beam drawing method
- Publication number 20060033050
- Publication date Feb 16, 2006
- Kimiaki Ando
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-electron beam exposure method and apparatus
- Publication number 20060017021
- Publication date Jan 26, 2006
- Haruo Yoda
- B82 - NANO-TECHNOLOGY

Person

Patents Grantslast 30 patents

Object information acquiring apparatus, information processing appa...

Object information acquiring apparatus and method of controlling same

Object information acquiring apparatus

Signal processing circuit and ultrasonic diagnostic apparatus

Object information acquiring apparatus

Received data processing apparatus of photoacoustic tomography

Measurement apparatus, movement control method, and program

Ultrasonic imaging apparatus and method of controlling delay

Measuring apparatus

Object information acquiring apparatus

Acoustic wave imaging apparatus and acoustic wave imaging method

Photoacoustic imaging apparatus

Charged particle beam exposure apparatus

Electron beam apparatus and method of generating an electron beam i...

Method and apparatus for inspecting integrated circuit pattern

Method for estimation of probe shape in charged particle beam instr...

Charged particle beam exposure apparatus

Charged particle beam apparatus

Electron beam apparatus and method of generating an electron beam i...

Charged particle beam drawing apparatus

Method and apparatus for inspecting integrated circuit pattern

Charged particle beam apparatus

Semiconductor inspection system

Multi-electron beam exposure method and apparatus

Charged particle beam apparatus

Method of charged particle beam lithography and equipment for charg...

Statistic calculating method using a template and corresponding sub...

Multi-electron beam exposure method and apparatus

Charged particle beam exposure method, charged particle beam exposu...

Exposure apparatus and exposure method

Patents Applicationslast 30 patents

SUBJECT INFORMATION ACQUISITION APPARATUS

RECEIVED DATA PROCESSING APPARATUS OF PHOTOACOUSTIC TOMOGRAPHY

OBJECT INFORMATION ACQUIRING APPARATUS AND METHOD OF CONTROLLING SAME

OBJECT INFORMATION ACQUIRING APPARATUS

OBJECT INFORMATION ACQUIRING APPARATUS, INFORMATION PROCESSING APPA...

SIGNAL PROCESSING CIRCUIT AND ULTRASONIC DIAGNOSTIC APPARATUS

OBJECT INFORMATION ACQUIRING APPARATUS

OBJECT INFORMATION ACQUIRING APPARATUS

OBJECT INFORMATION ACQUIRING APPARATUS

ACOUSTIC WAVE IMAGING APPARATUS AND ACOUSTIC WAVE IMAGING METHOD

SUBJECT INFORMATION ACQUISITION APPARATUS

ULTRASONIC IMAGING APPARATUS AND METHOD OF CONTROLLING DELAY

MEASUREMENT APPARATUS, MOVEMENT CONTROL METHOD, AND PROGRAM

MEASURING APPARATUS

CHARGED PARTICLE BEAM INSTRUMENT COMPRISING AN ABERRATION CORRECTOR

RECEIVED DATA PROCESSING APPARATUS OF PHOTOACOUSTIC TOMOGRAPHY

PHOTOACOUSTIC IMAGING APPARATUS

METHOD FOR ESTIMATION OF PROBE SHAPE IN CHARGED PARTICLE BEAM INSTR...

Electron Beam Apparatus And Method Of Generating An Electron Beam I...

Electron Beam Apparatus And Method of Generating An Electron Beam I...

METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN

Charged particle beam apparatus

CHARGED PARTICLE BEAM EXPOSURE APPARATUS

CHARGED PARTICLE BEAM EXPOSURE APPARATUS

Semiconductor inspection system

Electron beam apparatus and method of generating an electron beam i...

Charged particle beam apparatus

Method and apparatus for inspecting integrated circuit pattern

Electron-beam drawing apparatus and electron-beam drawing method

Multi-electron beam exposure method and apparatus