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Haruo Yoshida

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  • Tokyo, JP
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Patents Grantslast 30 patents

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    • Patent number D688636
    • Issue date Aug 27, 2013
    • SMK Corporation
    • Ryotaro Oishi
    • D13 - Equipment for production, distribution, or transformation of energy
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    • Patent number D678220
    • Issue date Mar 19, 2013
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    • Patent number D671503
    • Issue date Nov 27, 2012
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    • Patent number D665758
    • Issue date Aug 21, 2012
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    • Patent number D652804
    • Issue date Jan 24, 2012
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    • Patent number D652391
    • Issue date Jan 17, 2012
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    • Patent number D596589
    • Issue date Jul 21, 2009
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    • Patent number D596585
    • Issue date Jul 21, 2009
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    Curable polyvinyl benzyl compound and process for producing the same
    • Patent number 7,514,379
    • Issue date Apr 7, 2009
    • Showa Highpolymer Co., Ltd.
    • Shouji Nishiguchi
    • C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
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    • Patent number D589904
    • Issue date Apr 7, 2009
    • SMK Corporation
    • Haruo Yoshida
    • D13 - Equipment for production, distribution, or transformation of energy
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    Method and apparatus for environmental monitoring
    • Patent number 6,657,196
    • Issue date Dec 2, 2003
    • Advantest Corp.
    • Michiaki Endo
    • G01 - MEASURING TESTING
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    Integrated microcontact pin and method for manufacturing the same
    • Patent number 6,590,479
    • Issue date Jul 8, 2003
    • Advantest Corporation
    • Haruo Yoshida
    • G01 - MEASURING TESTING
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    Surface state monitoring method and apparatus
    • Patent number 6,545,279
    • Issue date Apr 8, 2003
    • Adramtest Corp.
    • Haruo Yoshida
    • H01 - BASIC ELECTRIC ELEMENTS
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    Substrate treating method and apparatus
    • Patent number 6,508,990
    • Issue date Jan 21, 2003
    • Advantest Corp.
    • Haruo Yoshida
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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    Surface state monitoring method and apparatus
    • Patent number 6,476,393
    • Issue date Nov 5, 2002
    • Advantest Corp.
    • Haruo Yoshida
    • G01 - MEASURING TESTING
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    Surface state monitoring method and apparatus
    • Patent number 6,433,339
    • Issue date Aug 13, 2002
    • Advantest Corp.
    • Yasuhiro Maeda
    • G01 - MEASURING TESTING
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    High precision reference voltage generator
    • Patent number 6,091,281
    • Issue date Jul 18, 2000
    • Advantest Corp.
    • Haruo Yoshida
    • G01 - MEASURING TESTING
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    Method and apparatus for inspecting foreign matter by examining fre...
    • Patent number 6,018,391
    • Issue date Jan 25, 2000
    • Advantest Corporation
    • Haruo Yoshida
    • G01 - MEASURING TESTING
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    Detection and analysis of a fine foreign matter on a sample
    • Patent number 6,005,660
    • Issue date Dec 21, 1999
    • Advantest Corporation
    • Haruo Yoshida
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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    Error rate measurement system for high speed optical pulse signals
    • Patent number 5,870,211
    • Issue date Feb 9, 1999
    • Advantest Corp.
    • Haruo Yoshida
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
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    Waveguide mode-strip line mode converter utilizing fin-line antenna...
    • Patent number 5,812,034
    • Issue date Sep 22, 1998
    • Advantest Corporation
    • Haruo Yoshida
    • H01 - BASIC ELECTRIC ELEMENTS
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    Backward brillouin scattering optical time domain reflectometry
    • Patent number 5,767,956
    • Issue date Jun 16, 1998
    • Advantest Corp.
    • Haruo Yoshida
    • G01 - MEASURING TESTING
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    Ultra high accuracy voltage measurement system
    • Patent number 5,764,048
    • Issue date Jun 9, 1998
    • Advantest Corp.
    • Haruo Yoshida
    • G01 - MEASURING TESTING
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    Hole burning effect measurement system
    • Patent number 5,644,398
    • Issue date Jul 1, 1997
    • Advantest Corporation
    • Haruo Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical system for ellipsometry utilizing a circularly polarized pr...
    • Patent number 5,619,325
    • Issue date Apr 8, 1997
    • Advantest Corporation
    • Haruo Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Key switch
    • Patent number 5,512,722
    • Issue date Apr 30, 1996
    • SMK Corporation
    • Kumio Ozeki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Operating unit for a key switch
    • Patent number 5,493,087
    • Issue date Feb 20, 1996
    • SMK Co., Ltd.
    • Haruo Yoshida
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Double-axis key switch
    • Patent number 5,448,026
    • Issue date Sep 5, 1995
    • SMK Corporation
    • Kumio Ozeki
    • H01 - BASIC ELECTRIC ELEMENTS
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    Keyboard switch
    • Patent number 5,430,267
    • Issue date Jul 4, 1995
    • SMK Corporation
    • Kumio Ozeki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Phase locked loop circuit
    • Patent number 5,117,204
    • Issue date May 26, 1992
    • Agency of Industrial Science and Technology
    • Tadashi Endo
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents