Harutaka Makabe

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit for detecting parasitic capacitance of TSV
- Patent number 11,742,250
- Issue date Aug 29, 2023
- Micron Technology, Inc.
- Harutaka Makabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TSV check circuit with replica path
- Patent number 11,164,856
- Issue date Nov 2, 2021
- Micron Technology, Inc.
- Harutaka Makabe
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUSES AND METHODS FOR TESTING MEMORY DEVICES
- Publication number 20240331794
- Publication date Oct 3, 2024
- Micron Technology, Inc.
- TAKAMASA SUZUKI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT FOR DETECTING PARASITIC CAPACITANCE OF TSV
- Publication number 20220059418
- Publication date Feb 24, 2022
- Micron Technology, Inc.
- Harutaka Makabe
- G01 - MEASURING TESTING
Information Patent Application
TSV CHECK CIRCUIT WITH REPLICA PATH
- Publication number 20210091058
- Publication date Mar 25, 2021
- Micron Technology, Inc.
- Harutaka Makabe
- H01 - BASIC ELECTRIC ELEMENTS