Haruyo Saitou

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus and condenser
- Patent number 7,632,463
- Issue date Dec 15, 2009
- Mitsubishi Kagaku Iatron, Inc.
- Hidehito Takayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analysis apparatus and condenser
- Publication number 20060182660
- Publication date Aug 17, 2006
- Hidehito Takayama
- G01 - MEASURING TESTING