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Haruyuki Tsuji

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  • Ina-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    INVERTED MICROSCOPE
    • Publication number 20130286473
    • Publication date Oct 31, 2013
    • OLYMPUS CORPORATION
    • Haruyuki TSUJI
    • G02 - OPTICS
  • Information Patent Application

    Visual inspection apparatus
    • Publication number 20080285022
    • Publication date Nov 20, 2008
    • OLYMPUS CORPORATION
    • Haruyuki Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    Observation apparatus with focal position control mechanism
    • Publication number 20070164194
    • Publication date Jul 19, 2007
    • OLYMPUS CORPORATION
    • Shunsuke Kurata
    • G02 - OPTICS
  • Information Patent Application

    Visual inspection apparatus
    • Publication number 20060238753
    • Publication date Oct 26, 2006
    • OLYMPUS CORPORATION
    • Haruyuki Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inspection apparatus
    • Publication number 20050207639
    • Publication date Sep 22, 2005
    • OLYMPUS CORPORATION
    • Kazuhito Horiuchi
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Semiconductor wafer inspection apparatus
    • Publication number 20050062960
    • Publication date Mar 24, 2005
    • Olympus Optical Co., Ltd.
    • Haruyuki Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor wafer inspection apparatus
    • Publication number 20030202178
    • Publication date Oct 30, 2003
    • Olympus Optical Co., Ltd.
    • Haruyuki Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    Defect detecting apparatus
    • Publication number 20020031249
    • Publication date Mar 14, 2002
    • Olympus Optical Co., Ltd.
    • Takahiro Komuro
    • G01 - MEASURING TESTING