Harvey Patashnick

Person

Voorheesville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
High-flow rate, low-noise, gas sampling apparatus and methods for c...
- Patent number 6,867,413
- Issue date Mar 15, 2005
- Rupprecht & Patashnick Company, Inc.
- Lauren R. Basch
- G01 - MEASURING TESTING
Information Patent Grant
Particulate mass measuring method with intrinsic correction for vol...
- Patent number 6,651,480
- Issue date Nov 25, 2003
- Rupprecht & Patashnick Company, Inc.
- Harvey Patashnick
- G01 - MEASURING TESTING
Information Patent Grant
Single detector differential particulate mass monitor with intrinsi...
- Patent number 6,502,450
- Issue date Jan 7, 2003
- Rupprecht & Patashnik Company, Inc.
- Harvey Patashnick
- G01 - MEASURING TESTING
Information Patent Grant
Gas stream conditioning apparatus, system and method for use in mea...
- Patent number 6,422,060
- Issue date Jul 23, 2002
- Rupprecht & Patashnick Company, Inc.
- Harvey Patashnick
- G01 - MEASURING TESTING
Information Patent Grant
Differential particulate mass monitor with intrinsic correction for...
- Patent number 6,205,842
- Issue date Mar 27, 2001
- Rupprecht & Patashnick Company, Inc.
- Harvey Patashnick
- G01 - MEASURING TESTING
Information Patent Grant
Gas stream conditioning apparatus, system and method for use in mea...
- Patent number 6,151,953
- Issue date Nov 28, 2000
- Rupprecht & Patashnick Company, Inc.
- Harvey Patashnick
- G01 - MEASURING TESTING
Information Patent Grant
Sequential air sampler with automatic sample collector changer
- Patent number 6,138,521
- Issue date Oct 31, 2000
- Rupprecht & Patashnick Company, Inc.
- Lauren R. Basch
- G01 - MEASURING TESTING
Information Patent Grant
Sequential air sampler with automatic sample collector changer
- Patent number 6,023,982
- Issue date Feb 15, 2000
- Rupprecht & Patashnick Company, Inc.
- Lauren R. Basch
- G01 - MEASURING TESTING
Information Patent Grant
In-stack direct particulate mass measurement apparatus and method w...
- Patent number 6,016,688
- Issue date Jan 25, 2000
- Rupprecht & Patashnick Company, Inc.
- John Hiss
- G01 - MEASURING TESTING
Information Patent Grant
In-stack direct particulate mass measurement apparatus and method
- Patent number 5,970,781
- Issue date Oct 26, 1999
- Rupprecht & Patashnick Company, Inc.
- John Hiss
- G01 - MEASURING TESTING
Information Patent Grant
Airborne particulate
- Patent number 5,553,507
- Issue date Sep 10, 1996
- Rupprecht & Patashnick Company, Inc.
- Lauren R. Basch
- G01 - MEASURING TESTING
Information Patent Grant
Dual flow path carbon particulate monitor
- Patent number 5,401,468
- Issue date Mar 28, 1995
- Rupprecht & Patashnick Company
- Harvey Patashnick
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Carbon particulate monitor with preseparator
- Patent number 5,279,970
- Issue date Jan 18, 1994
- Rupprecht & Patashnick Company, Inc.
- Harvey Patashnick
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Carbon particulate monitor
- Patent number 5,196,170
- Issue date Mar 23, 1993
- Rupprecht & Patashnick Company, Inc.
- Harvey Patashnick
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Constrained linear motion inertial balance
- Patent number 4,838,371
- Issue date Jun 13, 1989
- Rupprecht & Patashnick Co., Inc.
- Georg Rupprecht
- G01 - MEASURING TESTING
Information Patent Grant
Novel glass elements for use in balances
- Patent number 4,836,314
- Issue date Jun 6, 1989
- Rupprecht & Patashnick Co., Inc.
- Georg Rupprecht
- G01 - MEASURING TESTING
Information Patent Grant
Microbalance and method for measuring the mass of matter suspended...
- Patent number 4,391,338
- Issue date Jul 5, 1983
- Harvey Patashnick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-flow rate, low-noise, gas sampling apparatus and methods for c...
- Publication number 20060117872
- Publication date Jun 8, 2006
- Rupprecht and Patashnick Company, Inc.
- Lauren R. Basch
- G01 - MEASURING TESTING
Information Patent Application
High-flow rate, low-noise, gas sampling apparatus and methods for c...
- Publication number 20030234366
- Publication date Dec 25, 2003
- Rupprecht & Patashnick Company, Inc.
- Lauren R. Basch
- G01 - MEASURING TESTING
Information Patent Application
Particulate mass measuring method with intrinsic correction for vol...
- Publication number 20030051531
- Publication date Mar 20, 2003
- Rupprecht & Patashnick Company, Inc.
- Harvey Patashnick
- G01 - MEASURING TESTING

Harvey Patashnick

Person

Patents Grantslast 30 patents

High-flow rate, low-noise, gas sampling apparatus and methods for c...

Particulate mass measuring method with intrinsic correction for vol...

Single detector differential particulate mass monitor with intrinsi...

Gas stream conditioning apparatus, system and method for use in mea...

Differential particulate mass monitor with intrinsic correction for...

Gas stream conditioning apparatus, system and method for use in mea...

Sequential air sampler with automatic sample collector changer

Sequential air sampler with automatic sample collector changer

In-stack direct particulate mass measurement apparatus and method w...

In-stack direct particulate mass measurement apparatus and method

Airborne particulate

Dual flow path carbon particulate monitor

Carbon particulate monitor with preseparator

Carbon particulate monitor

Constrained linear motion inertial balance

Novel glass elements for use in balances

Microbalance and method for measuring the mass of matter suspended...

Patents Applicationslast 30 patents

High-flow rate, low-noise, gas sampling apparatus and methods for c...

High-flow rate, low-noise, gas sampling apparatus and methods for c...

Particulate mass measuring method with intrinsic correction for vol...