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Hassan Jalalian
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Saratoga, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Method and system for distinguishing spatial and thermal defects on...
Patent number
8,369,038
Issue date
Feb 5, 2013
MRA Tek LLC
Stephen Frank Meier
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and system for distinguishing spatial and thermal defects on...
Patent number
7,929,235
Issue date
Apr 19, 2011
MRA TEK, LLC
Stephen Frank Meier
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and system for distinguishing spatial and thermal defects on...
Patent number
7,532,422
Issue date
May 12, 2009
MRA TEK, LLC
Stephen Frank Meier
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
Method and System for Distinguishing Spatial and Thermal Defects on...
Publication number
20120044594
Publication date
Feb 23, 2012
MRA TEK, LLC
Stephen Frank Meier
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Distinguishing Spatial and Thermal Defects on...
Publication number
20090213712
Publication date
Aug 27, 2009
MRA TEK, LLC
Stephen Frank Meier
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DISTINGUISHING SPATIAL AND THERMAL DEFECTS ON...
Publication number
20080100942
Publication date
May 1, 2008
MRA Tek, LLC
Stephen Frank Meier
G01 - MEASURING TESTING