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Hassan Tanbakuchi
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Santa Rosa, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for cable phase correction for vector analyzer...
Patent number
9,841,449
Issue date
Dec 12, 2017
Keysight Technologies, Inc.
Michael Mikulka
G01 - MEASURING TESTING
Information
Patent Grant
Forward coupled directional coupler
Patent number
9,184,484
Issue date
Nov 10, 2015
Keysight Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detecting responses of micro-electromechanical system (MEMS) resona...
Patent number
8,952,891
Issue date
Feb 10, 2015
Keysight Technologies, Inc.
Hassan Tanbakuchi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Dopant profile measurement module, method and apparatus
Patent number
8,471,580
Issue date
Jun 25, 2013
Agilent Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Signal coupling system for scanning microwave microscope
Patent number
7,793,356
Issue date
Sep 7, 2010
Agilent Technologies, Inc.
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Grant
Self-supported strip line coupler
Patent number
7,535,316
Issue date
May 19, 2009
Agilent Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave spectroscopy probe
Patent number
7,532,015
Issue date
May 12, 2009
Agilent Technologies, Inc.
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analysis system and method using offset stimulus sig...
Patent number
7,518,353
Issue date
Apr 14, 2009
Agilent Technologies, Inc.
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Grant
Electrical interconnection for coaxial line to slab line structure...
Patent number
7,295,084
Issue date
Nov 13, 2007
Agilent Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Balanced microwave cable adaptor having a connector interface secur...
Patent number
7,221,245
Issue date
May 22, 2007
Agilent Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Impedance analyzer
Patent number
7,161,358
Issue date
Jan 9, 2007
Agilent Technologies, Inc.
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring a digital device
Patent number
7,088,109
Issue date
Aug 8, 2006
Agilent Technologies, Inc.
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Grant
Low-pass filter transmission line with integral electroabsorption m...
Patent number
7,031,558
Issue date
Apr 18, 2006
Hassan Tanbakuchi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Balanced microwave connector and transition using a coaxial structure
Patent number
6,937,109
Issue date
Aug 30, 2005
Agilent Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Routing YIG-tuned mixer
Patent number
5,553,319
Issue date
Sep 3, 1996
Hewlett-Packard Company
Hassan Tanbakuchi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated barium-ferrite tuned mixer for spectrum analysis to 60 GHz
Patent number
5,465,417
Issue date
Nov 7, 1995
Hewlett-Packard Company
Hassan Tanbakuchi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
YIG-tuned circuit with rotatable magnetic polepiece
Patent number
5,294,899
Issue date
Mar 15, 1994
Hewlett-Packard Company
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tracking YIG tuned filter-mixer
Patent number
4,817,200
Issue date
Mar 28, 1989
Hewlett-Packard Company
Hassan Tanbakuchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR CABLE PHASE CORRECTION FOR VECTOR ANALYZER...
Publication number
20170153280
Publication date
Jun 1, 2017
Keysight Technologies, Inc.
Michael Mikulka
G01 - MEASURING TESTING
Information
Patent Application
FORWARD COUPLED DIRECTIONAL COUPLER
Publication number
20140118082
Publication date
May 1, 2014
AGILENT TECHNOLOGIES, INC.
HASSAN TANBAKUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTING RESPONSES OF MICRO-ELECTROMECHANICAL SYSTEM (MEMS) RESONA...
Publication number
20130169341
Publication date
Jul 4, 2013
AGILENT TECHNOLOGIES, INC.
Hassan Tanbakuchi
B82 - NANO-TECHNOLOGY
Information
Patent Application
DOPANT PROFILE MEASUREMENT MODULE, METHOD AND APPARATUS
Publication number
20100244870
Publication date
Sep 30, 2010
AGILENT TECHNOLGIES, INC.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Signal Coupling System For Scanning Microwave Microscope
Publication number
20100058846
Publication date
Mar 11, 2010
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Application
Center Conductor to Integrated Circuit for High Frequency Applications
Publication number
20090079042
Publication date
Mar 26, 2009
AGILENT TECHNOLOGIES, INC.
Jim Clatterbaugh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
N-port signal separation apparatus with improved frequency selectiv...
Publication number
20080020726
Publication date
Jan 24, 2008
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Application
Double-sided wafer probe
Publication number
20070296423
Publication date
Dec 27, 2007
Michael B. Whitener
G01 - MEASURING TESTING
Information
Patent Application
Vector network analysis system and method using offset stimulus sig...
Publication number
20070236230
Publication date
Oct 11, 2007
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Application
Microwave spectroscopy probe
Publication number
20070132460
Publication date
Jun 14, 2007
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Application
Self-supported strip line coupler
Publication number
20070109071
Publication date
May 17, 2007
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High isolation, low loss electronic interconnection
Publication number
20070069832
Publication date
Mar 29, 2007
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Slabline structure with rotationally offset ground
Publication number
20070024388
Publication date
Feb 1, 2007
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for measuring a digital device
Publication number
20060066289
Publication date
Mar 30, 2006
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Application
Balanced microwave cable adaptor
Publication number
20050140459
Publication date
Jun 30, 2005
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Low-pass filter transmission line with integral electroabsorption m...
Publication number
20050058385
Publication date
Mar 17, 2005
Hassan Tanbakuchi
G02 - OPTICS
Information
Patent Application
Balanced microwave connector and transition
Publication number
20040108914
Publication date
Jun 10, 2004
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS