Haw-Jyue Luo

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Hsin-Chu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for rejecting tuning disturbances to improve lamp failure pr...
- Patent number 10,140,394
- Issue date Nov 27, 2018
- Applied Materials, Inc.
- Subrahmanyam Venkata Rama Kommisetti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for integrating manual and automated technique...
- Patent number 9,697,470
- Issue date Jul 4, 2017
- Applied Materials, Inc.
- Jimmy Iskandar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and related system for semiconductor equipment early warning...
- Patent number 6,999,897
- Issue date Feb 14, 2006
- Powerchip Semiconductor Corp.
- Hung-En Tai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for analyzing in-line QC test parameters
- Patent number 6,959,252
- Issue date Oct 25, 2005
- Powerchip Semiconductor Corp.
- Hung-En Tai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for analyzing defect inspection parameters
- Patent number 6,828,776
- Issue date Dec 7, 2004
- Powerchip Semiconductor Corp.
- Hung-En Tai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR REJECTING TUNING DISTURBANCES TO IMPROVE LAMP FAILURE PR...
- Publication number 20160092618
- Publication date Mar 31, 2016
- Applied Materials, Inc.
- Subrahmanyam Venkata Rama KOMMISETTI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INTEGRATING MANUAL AND AUTOMATED TECHNIQUE...
- Publication number 20150302311
- Publication date Oct 22, 2015
- Applied Materials, Inc.
- Jimmy ISKANDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA ANALYZING METHOD FOR A FAULT DETECTION AND CLASSIFICATION SYSTEM
- Publication number 20060048010
- Publication date Mar 2, 2006
- Hung-En Tai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND RELATED SYSTEM FOR SEMICONDUCTOR EQUIPMENT EARLY WARNING...
- Publication number 20050203715
- Publication date Sep 15, 2005
- Hung-En Tai
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR ANALYZING IN-LINE QC TEST PARAMETERS
- Publication number 20050004773
- Publication date Jan 6, 2005
- Hung-En Tai
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR ANALYZING DEFECT INSPECTION PARAMETERS
- Publication number 20040124830
- Publication date Jul 1, 2004
- Hung-En Tai
- G01 - MEASURING TESTING